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An investigation of chaos in the \(RL\)-diode circuit using the BDS test. (English) Zbl 1054.62630
Summary: An \(RL\)-diode circuit driven by a sinusoidal voltage is employed to obtain nonlinear experimental data. The BDS test statistic is used to analyse these data. According to the results of the analysis for the first differenced order data, chaotic structure has been found for each \(e\) value.
MSC:
62P30 Applications of statistics in engineering and industry; control charts
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