Del Castillo, Enrique; Göb, Rainer; von Collani, Elart A methodological approach to the integration of SPC and EPC in discrete manufacturing processes. (English) Zbl 1184.62217 Park, Sung H. (ed.) et al., Statistical process monitoring and optimization. New York, NY: Marcel Dekker (ISBN 0-8247-6007-7/hbk). Stat., Textb. Monogr. 160, 77-105 (2000). For the entire collection see [Zbl 0952.00010]. Cited in 1 Document MSC: 62P30 Applications of statistics in engineering and industry; control charts PDFBibTeX XMLCite \textit{E. Del Castillo} et al., Stat., Textb. Monogr. 160, 77--105 (2000; Zbl 1184.62217)