Dey, Tamal K.; Giesen, Joachim; Ramos, Edgar A.; Sadri, Bardia Critical points of distance to an \(\varepsilon\)-sampling of a surface and flow-complex-based surface reconstruction. (English) Zbl 1151.65016 Int. J. Comput. Geom. Appl. 18, No. 1-2, 29-61 (2008). Reviewer: Ljubiša Kocić (Niš) MSC: 65D18 PDFBibTeX XMLCite \textit{T. K. Dey} et al., Int. J. Comput. Geom. Appl. 18, No. 1--2, 29--61 (2008; Zbl 1151.65016) Full Text: DOI
Dey, Tamal K.; Giesen, Joachim; Ramos, Edgar A.; Sadri, Bardia Critical points of the distance to an epsilon-sampling of a surface and flow-complex-based surface reconstruction. (English) Zbl 1387.65015 Proceedings of the 21st annual symposium on computational geometry, SCG 2005, Pisa, Italy, June 6–8, 2005. New York, NY: Association for Computing Machinery (ACM) (ISBN 1-58113-991-8). 218-227 (2005). MSC: 65D18 PDFBibTeX XMLCite \textit{T. K. Dey} et al., in: Proceedings of the 21st annual symposium on computational geometry, SCG 2005, Pisa, Italy, June 6--8, 2005. New York, NY: Association for Computing Machinery (ACM). 218--227 (2005; Zbl 1387.65015) Full Text: DOI