van Lith, Bart S.; Hansen, Per Christian; Hochstenbach, Michiel E. A twin error gauge for Kaczmarz’s iterations. (English) Zbl 1490.65072 SIAM J. Sci. Comput. 43, No. 5, S173-S199 (2021). MSC: 65F22 65F10 65R32 65F15 PDFBibTeX XMLCite \textit{B. S. van Lith} et al., SIAM J. Sci. Comput. 43, No. 5, S173--S199 (2021; Zbl 1490.65072) Full Text: DOI
van Lith, Bart S.; Hansen, Per Christian; Hochstenbach, Michiel E. A twin error gauge for Kaczmarz’s iterations. (English) Zbl 1512.65072 SIAM J. Sci. Comput. 43, No. 3, S173-S199 (2021). MSC: 65F22 65F10 65R32 65F15 PDFBibTeX XMLCite \textit{B. S. van Lith} et al., SIAM J. Sci. Comput. 43, No. 3, S173--S199 (2021; Zbl 1512.65072) Full Text: DOI arXiv
Dong, Yiqiu; Hansen, Per Christian; Hochstenbach, Michiel E.; Brogaard Riis, Nicolai André Fixing nonconvergence of algebraic iterative reconstruction with an unmatched backprojector. (English) Zbl 1420.65031 SIAM J. Sci. Comput. 41, No. 3, A1822-A1839 (2019). MSC: 65F10 65F15 65F22 15A18 15A60 PDFBibTeX XMLCite \textit{Y. Dong} et al., SIAM J. Sci. Comput. 41, No. 3, A1822--A1839 (2019; Zbl 1420.65031) Full Text: DOI arXiv