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Yuen, K. C.; Burke, M. D. A test of fit for a semiparametric additive risk model. (English) Zbl 0888.62046 Biometrika 84, No. 3, 631-639 (1997). MSC: 62G10 62G20 62P10 PDFBibTeX XMLCite \textit{K. C. Yuen} and \textit{M. D. Burke}, Biometrika 84, No. 3, 631--639 (1997; Zbl 0888.62046) Full Text: DOI