Ahues, Mario; Chatelin, Francoise The use of defect correction to refine the eigenelements of compact integral operators. (English) Zbl 0528.65073 SIAM J. Numer. Anal. 20, 1087-1093 (1983). Page: −5 −4 −3 −2 −1 ±0 +1 +2 +3 +4 +5 Show Scanned Page Cited in 8 Documents MSC: 65R20 Numerical methods for integral equations 45B05 Fredholm integral equations 45C05 Eigenvalue problems for integral equations Keywords:deflect correction; two-level multigrid; iterative refinement PDFBibTeX XMLCite \textit{M. Ahues} and \textit{F. Chatelin}, SIAM J. Numer. Anal. 20, 1087--1093 (1983; Zbl 0528.65073) Full Text: DOI