Sreedharan, K. E. Estimation of periodically changing failure rate. (English) Zbl 0396.62074 IEEE Trans. Reliab. 28, 32-34 (1979). Page: −5 −4 −3 −2 −1 ±0 +1 +2 +3 +4 +5 Show Scanned Page MSC: 62N05 Reliability and life testing Keywords:Periodically Changing Failure Rate; Maximum Likelihood Estimators; Exponential Distributions PDF BibTeX XML Cite \textit{K. E. Sreedharan}, IEEE Trans. Reliab. 28, 32--34 (1979; Zbl 0396.62074) Full Text: DOI OpenURL