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TEST: Testing environment for embedded systems based on TTCN-3 in SILS. (English) Zbl 1185.68085
Ślęzak, Dominik (ed.) et al., Advances in software engineering. International conference on advanced software engineering and its applications, ASEA 2009. Held as part of the future generation information technology conference, FGIT 2009, Jeju Island, Korea, December 10–12, 2009. Proceedings. Berlin: Springer (ISBN 978-3-642-10618-7/pbk; 978-3-642-10619-4/ebook). Communications in Computer and Information Science 59, 204-212 (2009).
Summary: The Testing and Test Control Notation Version 3 (TTCN-3) is an internationally standardized language for defining test specifications for a wide range of computer and telecommunication systems. Since embedded systems software is frequently used in case that safety is a primary issue and reliability is critical in the systems, it is necessary for the embedded systems software to use a systematic testing method such as TTCN-3. Unfortunately, the difference of testing environment between embedded and PC-based software makes developers hard to test the software, and hence products not tested thoroughly could be released in the market, which can be a potential disaster.
In this paper, we review the TTCN-3 testing system and suggest a modified TTCN-3 testing environment for embedded systems software in Software In the Loop Simulation. A simple example shows our demonstration of testing embedded systems software based on the proposed TTCN-3 testing system.
For the entire collection see [Zbl 1183.68022].
68M15 Reliability, testing and fault tolerance of networks and computer systems
68N99 Theory of software
68M99 Computer system organization
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