Mudholkar, Govind S.; Srivastava, Deo Kumar Exponentiated Weibull family for analyzing bathtub failure-rate data. (English) Zbl 0800.62609 IEEE Trans. Reliab. 42, No. 2, 299-302 (1993). Cited in 4 ReviewsCited in 281 Documents MSC: 62N05 Reliability and life testing PDF BibTeX XML Cite \textit{G. S. Mudholkar} and \textit{D. K. Srivastava}, IEEE Trans. Reliab. 42, No. 2, 299--302 (1993; Zbl 0800.62609) Full Text: DOI OpenURL