Li, Stan Z. Markov random field modeling in image analysis. 3rd ed. (English) Zbl 1183.68691 Advances in Pattern Recognition. London: Springer (ISBN 978-1-84800-278-4/hbk; 978-1-84800-279-1/ebook). xxiii, 357 p. (2009). See the review of the second edition (2001) in Zbl 0978.68130 Cited in 32 Documents MSC: 68U10 Computing methodologies for image processing 68-02 Research exposition (monographs, survey articles) pertaining to computer science Citations:Zbl 0978.68130 PDF BibTeX XML Cite \textit{S. Z. Li}, Markov random field modeling in image analysis. 3rd ed. London: Springer (2009; Zbl 1183.68691) Full Text: DOI OpenURL