Hoaglin, David C. (ed.); Mosteller, Frederick (ed.); Tukey, John W. (ed.) [Diaconis, Persi; Godfrey, Katherine; Emerson, John D.; Wong, Gregory Y.; Cook, Nancy; Mosteller, Frederick; Parunak, Anita; Siegel, Andrew F.; Trapido, Edward; Youtz, Cleo; Hoaglin, David C.; Li, Guoying; Tukey, John W.] Exploring data tables, trends, and shapes. (English) Zbl 1095.62003 Wiley Series in Probability and Statistics. Hoboken, NJ: John Wiley & Sons (ISBN 0-470-04005-X/pbk; 978-1-1181-5069-6/ebook). xxii, 527 p. (2006). Reviewer: Raúl Mentz (S. M. de Tucuman) MSC: 62-07 62-06 00B15 PDFBibTeX XMLCite \textit{D. C. Hoaglin} (ed.) et al., Exploring data tables, trends, and shapes. Hoboken, NJ: John Wiley \& Sons (2006; Zbl 1095.62003) Full Text: Link
Wainer, Howard (ed.) [Wainer, H.; Hartigan, J.; Tukey, J. W.; Singer, B.; Heckman, J. J.; Robb, R.; Glynn, R. J.; Laird, N. M.; Rubin, D. B.; Holland, P. W.] Drawing inferences from self-selected samples. (Papers from a conference sponsored by Educational Testing Service). (English) Zbl 0613.62148 New York etc.: Springer-Verlag. XIII, 163 p. DM 45.00 (1986). Reviewer: V.Cohen MSC: 62P99 62-01 62D05 62-06 PDFBibTeX XML
Johnstone, Iain M.; Velleman, Paul F. [Tukey, J. W.] The resistant line and related regression methods. (English) Zbl 0594.62077 J. Am. Stat. Assoc. 80, 1041-1059 (1985). MSC: 62J05 62F35 PDFBibTeX XMLCite \textit{I. M. Johnstone} and \textit{P. F. Velleman}, J. Am. Stat. Assoc. 80, 1041--1059 (1985; Zbl 0594.62077) Full Text: DOI
Hoaglin, David C. (ed.); Mosteller, Frederick (ed.); Tukey, John W. (ed.) [Emerson, J. D.; Hoaglin, D. C.; Strenio, J.; Stoto, M. A.; Goodall, C.; Mosteller, F.; Tukey, J. W.; Rosenberger, J. L.; Gasko, M.; Iglewicz, B.] Understanding robust and exploratory data analysis. (English) Zbl 0599.62007 Wiley Series in Probability and Mathematical Statistics. Applied Probability and Statistics. New York etc.: John Wiley & Sons, Inc. 500 p. (1983). MSC: 62-07 62-02 62F35 62G05 PDFBibTeX XML
Barnett, Vic (ed.) [Green, P. J.; Sibson, R.; Silverman, B. W.; Diggle, P. J.; Kendall, D. G.; Gower, J. C.; Digby, P. G. N.; Greenacre, M. J.; Gabriel, K. R.; Andrews, D. F.; Tukey, P. A.; Tukey, J. W.; Everitt, B. S.; Fienberg, S. E.; Meyer, M. M.; Wasserman, S. S.; Goldstein, H.; Graham, I.; Smith, A. F. M.; Spiegelhalter, D. J.] Interpreting multivariate data. Proceedings of the Conference on Looking at Multivariate Data held in the University of Sheffield, Sheffield, March 24-27, 1980. (English) Zbl 0597.62002 Wiley Series in Probability and Mathematical Statistics. Chichester etc.: John Wiley & Sons Ltd. XVI, 374 p. (1981). MSC: 62-07 62-02 62H99 62-06 65S05 00B25 PDFBibTeX XML
Monge, Peter R. (ed.); Cappella, Joseph N. (ed.) [Fink, Edward L.; Bochner, Arthur P.; Fitzpatrick, Mary Anne; Tucker, Raymond K.; Chase, Lawrence J.; Hunter, John E.; Krippendorff, Klaus; Norton, Robert W.; Woelfel, Joseph; Danes, Jeffrey E.; Farace, Richard V.; Mabee, Timothy; Hewes, Dean; Davis, Dennis K.; Lee, Jae-Won; Richards, William D.; Tukey, John W.; Huber, Kook Ching; McLaughlin, Margaret L.] Multivariate techniques in human communication research. (English) Zbl 0465.62110 Human Communication Research Series. New York etc.: Academic Press. XXIV, 552 p. $ 45.00 (1980). MSC: 62P99 94A05 62-06 62-02 62-04 65C20 94-02 94C99 62Hxx 62P25 PDFBibTeX XML
Launer, Robert L. (ed.); Wilkinson, Graham N. (ed.) [Hogg, R. V.; Andrews, D. F.; Huber, P. J.; Johns, M. V.; David, H. A.; Tukey, J. W.; Agee, W. S.; Turner, R. H.; Johnson, N. L.; Martin, R. D.; Van de Linde, V. D.; Box, G. E. P.; Parzen, E.; Wilkinson, G. N.] Robustness in statistics. Proceedings of a workshop, sponsored by the Mathematics Division, Army Research Office, held at Army Research Office, Research Triangle Park, North Carolina, Weiss Building, April 11-12, 1978. (English) Zbl 0441.62033 New York - San Francisco - London: Academic Press. XVI, 296 p. $ 21.50 (1979). MSC: 62F35 62-06 62-07 62M10 94A05 93E10 PDFBibTeX XML
David, H. A. (ed.) [Cochran, W. G.; Kempthorne, O.; Sampford, M. R.; Bryant, E. C.; Hansen, M. H.; Tepping, B. J.; Rao, J. N. K.; Williams, W. H.; Cochran, R. S.; Hocking, R. N.; Hackney, O. P.; Speed, F. M.; Hemmerle, W. J.; Downs, B. W.; Kshirsagar, A. M.; Sonvico, V.; Searle, S. R.; Smith, W. B.; Scott, D. M.; Box, G. E. P.; Tiao, G. C.; Gentle, J. E.; David, H. A.; Shu, V. S.; Tukey, J. W.; Johnson, N. L.; Pfaffenberger, R. C.; Dinkel, J. J.; Owen, D. B.; Haas, R. W.] Contributions to survey sampling and applied statistics. Papers in honor of H. O. Hartley. (English) Zbl 0437.62001 New York, San Francisco, London: Academic Press. XXVII, 318 p. $ 46.00 (1978). MSC: 62-02 62D05 62J10 65C99 62J05 62Q05 62F35 PDFBibTeX XML