Priebe, Carey E.; Chen, Dalei Spatial scan density estimates. (English) Zbl 1072.62559 Technometrics 43, No. 1, 73-83 (2001). MSC: 62G07 PDFBibTeX XMLCite \textit{C. E. Priebe} and \textit{D. Chen}, Technometrics 43, No. 1, 73--83 (2001; Zbl 1072.62559) Full Text: DOI
Fokianos, Konstantinos; Kedem, Benjamin; Qin, Jing; Short, David A. A semiparametric approach to the one-way layout. (English) Zbl 1072.62583 Technometrics 43, No. 1, 56-65 (2001). MSC: 62G99 62G08 62J10 PDFBibTeX XMLCite \textit{K. Fokianos} et al., Technometrics 43, No. 1, 56--65 (2001; Zbl 1072.62583) Full Text: DOI
Puig, Pedro; Stephens, Michael A. Tests of fit for the Laplace distribution, with applications. (English) Zbl 0996.62050 Technometrics 42, No. 4, 417-424 (2000). MSC: 62G10 62G20 62G30 PDFBibTeX XMLCite \textit{P. Puig} and \textit{M. A. Stephens}, Technometrics 42, No. 4, 417--424 (2000; Zbl 0996.62050) Full Text: DOI
Huang, H.-C.; Cressie, N. Deterministic/stochastic wavelet decomposition for recovery of signal from noisy data. (English) Zbl 1013.62045 Technometrics 42, No. 3, 262-276 (2000). MSC: 62G08 62C12 62M40 65T60 PDFBibTeX XMLCite \textit{H. C. Huang} and \textit{N. Cressie}, Technometrics 42, No. 3, 262--276 (2000; Zbl 1013.62045) Full Text: DOI
McKean, Joseph W.; Sheather, Simon J. Partial residual plots based on robust fits. (English) Zbl 1013.62057 Technometrics 42, No. 3, 249-261 (2000). MSC: 62G35 62J20 62J05 PDFBibTeX XMLCite \textit{J. W. McKean} and \textit{S. J. Sheather}, Technometrics 42, No. 3, 249--261 (2000; Zbl 1013.62057) Full Text: DOI
De Veaux, Richard D.; Schumi, Jennifer; Schweinsberg, Jason; Ungar, Lyle H. Prediction intervals for neural networks via nonlinear regression. (English) Zbl 1063.62582 Technometrics 40, No. 4, 273-282 (1998). MSC: 62M45 62G08 62M20 PDFBibTeX XMLCite \textit{R. D. De Veaux} et al., Technometrics 40, No. 4, 273--282 (1998; Zbl 1063.62582) Full Text: DOI
Hu, X. Joan; Lawless, Jerald F.; Suzuki, Kazuyuki Nonparametric estimation of a lifetime distribution when censoring times are missing. (English) Zbl 0896.62031 Technometrics 40, No. 1, 3-13 (1998). MSC: 62G05 62N05 62G07 PDFBibTeX XMLCite \textit{X. J. Hu} et al., Technometrics 40, No. 1, 3--13 (1998; Zbl 0896.62031) Full Text: DOI Link
Hall, Peter; Padmanabhan, A. R. Adaptive inference for the two-sample scale problem. (English) Zbl 0913.62046 Technometrics 39, No. 4, 412-422 (1997). MSC: 62G10 62F35 62G35 62G09 PDFBibTeX XMLCite \textit{P. Hall} and \textit{A. R. Padmanabhan}, Technometrics 39, No. 4, 412--422 (1997; Zbl 0913.62046) Full Text: DOI
Loughin, Thomas M.; Noble, William A permutation test for effects in an unreplicated factorial design. (English) Zbl 0882.62074 Technometrics 39, No. 2, 180-190 (1997). MSC: 62K15 62G10 PDFBibTeX XMLCite \textit{T. M. Loughin} and \textit{W. Noble}, Technometrics 39, No. 2, 180--190 (1997; Zbl 0882.62074) Full Text: DOI
Ruppert, David; Wand, M. P.; Holst, Ulla; Hössjer, Ola Local polynomial variance-function estimation. (English) Zbl 0891.62029 Technometrics 39, No. 3, 262-273 (1997). MSC: 62G07 62P99 62G20 PDFBibTeX XMLCite \textit{D. Ruppert} et al., Technometrics 39, No. 3, 262--273 (1997; Zbl 0891.62029) Full Text: DOI Link
Faraway, Julian J. Regression analysis for a functional response. (English) Zbl 0891.62027 Technometrics 39, No. 3, 254-261 (1997). MSC: 62G07 PDFBibTeX XMLCite \textit{J. J. Faraway}, Technometrics 39, No. 3, 254--261 (1997; Zbl 0891.62027) Full Text: DOI Link
Efromovich, Sam; Thomas, Edward V. Application of nonparametric binary regression to evaluate the sensitivity of explosives. (English) Zbl 0900.62536 Technometrics 38, No. 1, 50-58 (1996). MSC: 62N05 62N99 62G07 PDFBibTeX XMLCite \textit{S. Efromovich} and \textit{E. V. Thomas}, Technometrics 38, No. 1, 50--58 (1996; Zbl 0900.62536) Full Text: DOI
Deutsch, Clayton V. Constrained smoothing of histograms and scatterplots with simulated annealing. (English) Zbl 0898.62126 Technometrics 38, No. 3, 266-274 (1996). MSC: 62N99 62G99 PDFBibTeX XMLCite \textit{C. V. Deutsch}, Technometrics 38, No. 3, 266--274 (1996; Zbl 0898.62126) Full Text: DOI
Baker, R. D. Some new tests of the power law process. (English) Zbl 0898.62121 Technometrics 38, No. 3, 256-265 (1996). MSC: 62N05 62G10 PDFBibTeX XMLCite \textit{R. D. Baker}, Technometrics 38, No. 3, 256--265 (1996; Zbl 0898.62121) Full Text: DOI
García-Jurado, I.; González-Manteiga, W.; Prada-Sánchez, J. M.; Febrero-Bande, M.; Cao, R. Predicting using Box-Jenkins, nonparametric, and bootstrap techniques. (English) Zbl 0837.62071 Technometrics 37, No. 3, 303-310 (1995). MSC: 62M20 62G09 62G07 PDFBibTeX XMLCite \textit{I. García-Jurado} et al., Technometrics 37, No. 3, 303--310 (1995; Zbl 0837.62071) Full Text: DOI
Wolstenholme, Linda C. A nonparametric test of the weakest-link principle. (English) Zbl 0822.62088 Technometrics 37, No. 2, 169-175 (1995). MSC: 62N05 62G10 PDFBibTeX XMLCite \textit{L. C. Wolstenholme}, Technometrics 37, No. 2, 169--175 (1995; Zbl 0822.62088) Full Text: DOI
Lawless, J. F.; Nadeau, C. Some simple robust methods for the analysis of recurrent events. (English) Zbl 0822.62085 Technometrics 37, No. 2, 158-168 (1995). MSC: 62N05 62G05 62F35 62M09 PDFBibTeX XMLCite \textit{J. F. Lawless} and \textit{C. Nadeau}, Technometrics 37, No. 2, 158--168 (1995; Zbl 0822.62085) Full Text: DOI
Nelson, Wayne Confidence limits for recurrence data – applied to cost or number of product repairs. (English) Zbl 0822.62084 Technometrics 37, No. 2, 147-157 (1995). MSC: 62N05 62G15 62A09 PDFBibTeX XMLCite \textit{W. Nelson}, Technometrics 37, No. 2, 147--157 (1995; Zbl 0822.62084) Full Text: DOI
Zhang, Heping Maximal correlation and adaptive splines. (English) Zbl 0800.62229 Technometrics 36, No. 2, 196-201 (1994). MSC: 62G07 62H20 62J05 65C99 PDFBibTeX XMLCite \textit{H. Zhang}, Technometrics 36, No. 2, 196--201 (1994; Zbl 0800.62229) Full Text: DOI
Schmoyer, Richard L. Asymptotically valid prediction intervals for linear models. (English) Zbl 0850.62557 Technometrics 34, No. 4, 399-408 (1992). MSC: 62J10 62G07 PDFBibTeX XMLCite \textit{R. L. Schmoyer}, Technometrics 34, No. 4, 399--408 (1992; Zbl 0850.62557) Full Text: DOI
Léger, Christian; Politis, Dimitris N.; Romano, Joseph P. Bootstrap technology and applications. (English) Zbl 0850.62367 Technometrics 34, No. 4, 378-398 (1992). MSC: 62G09 62E20 PDFBibTeX XMLCite \textit{C. Léger} et al., Technometrics 34, No. 4, 378--398 (1992; Zbl 0850.62367) Full Text: DOI
Breiman, Leo The \(\Pi\) method for estimating multivariate functions from noisy data. (With discussion). (English) Zbl 0742.62037 Technometrics 33, No. 2, 125-160 (1991). Reviewer: H.Liero (Berlin) MSC: 62G07 62H12 PDFBibTeX XMLCite \textit{L. Breiman}, Technometrics 33, No. 2, 125--160 (1991; Zbl 0742.62037) Full Text: DOI
Hamilton, Martin A.; Collings, Bruce Jay Determining the appropriate sample size for nonparametric tests for location shift. (English) Zbl 0850.62395 Technometrics 33, No. 3, 327-337 (1991). MSC: 62G10 PDFBibTeX XMLCite \textit{M. A. Hamilton} and \textit{B. J. Collings}, Technometrics 33, No. 3, 327--337 (1991; Zbl 0850.62395) Full Text: DOI
Boos, Dennis D.; Brownie, Cavell Bootstrap methods for testing homogeneity of variances. (English) Zbl 0668.62016 Technometrics 31, No. 1, 69-82 (1989). MSC: 62F03 62G10 62P30 PDFBibTeX XMLCite \textit{D. D. Boos} and \textit{C. Brownie}, Technometrics 31, No. 1, 69--82 (1989; Zbl 0668.62016) Full Text: DOI Link
Carroll, R. J.; Spiegelman, C. H.; Sacks, J. A quick and easy multiple-use calibration-curve procedure. (English) Zbl 0664.62047 Technometrics 30, No. 2, 137-141 (1988). MSC: 62G99 62G15 PDFBibTeX XMLCite \textit{R. J. Carroll} et al., Technometrics 30, No. 2, 137--141 (1988; Zbl 0664.62047) Full Text: DOI Link
O’Reilly, F. J.; Stephens, M. A. Transforming censored samples for testing fit. (English) Zbl 0641.62030 Technometrics 30, No. 1, 79-86 (1988). MSC: 62G10 PDFBibTeX XMLCite \textit{F. J. O'Reilly} and \textit{M. A. Stephens}, Technometrics 30, No. 1, 79--86 (1988; Zbl 0641.62030) Full Text: DOI
Iman, Ronald L.; Conover, W. J. A measure of top-down correlation. (English) Zbl 0639.62041 Technometrics 29, 351-357 (1987). MSC: 62G10 62H20 62F07 PDFBibTeX XMLCite \textit{R. L. Iman} and \textit{W. J. Conover}, Technometrics 29, 351--357 (1987; Zbl 0639.62041) Full Text: DOI
Yanagimoto, Takemi; Yanagimoto, Masakatsu The use of marginal likelihood for a diagnostic test for the goodness of fit of the simple linear regression model. (English) Zbl 0608.62055 Technometrics 29, 95-101 (1987). MSC: 62G10 62J99 62J05 PDFBibTeX XMLCite \textit{T. Yanagimoto} and \textit{M. Yanagimoto}, Technometrics 29, 95--101 (1987; Zbl 0608.62055) Full Text: DOI
Denby, L.; Vardi, Y. The survival curve with decreasing density. (English) Zbl 0656.62049 Technometrics 28, 359-367 (1986). MSC: 62G05 PDFBibTeX XMLCite \textit{L. Denby} and \textit{Y. Vardi}, Technometrics 28, 359--367 (1986; Zbl 0656.62049) Full Text: DOI
Lombard, F. The change-point problem for angular data: A nonparametric approach. (English) Zbl 0616.62059 Technometrics 28, 391-397 (1986). Reviewer: J.Deshayes MSC: 62G10 65C99 PDFBibTeX XMLCite \textit{F. Lombard}, Technometrics 28, 391--397 (1986; Zbl 0616.62059) Full Text: DOI
Schmoyer, Richard L. An exact distribution-free analysis for accelerated life testing at several levels of a single stress. (English) Zbl 0588.62177 Technometrics 28, 165-175 (1986). MSC: 62N05 62G10 PDFBibTeX XMLCite \textit{R. L. Schmoyer}, Technometrics 28, 165--175 (1986; Zbl 0588.62177) Full Text: DOI
Simonoff, Jeffrey S.; Tsai, Chih-Ling Jackknife-based estimators and confidence regions in nonlinear regression. (English) Zbl 0588.62106 Technometrics 28, 103-112 (1986). MSC: 62J02 62G05 62G15 PDFBibTeX XMLCite \textit{J. S. Simonoff} and \textit{C.-L. Tsai}, Technometrics 28, 103--112 (1986; Zbl 0588.62106) Full Text: DOI
Brown, Philip J.; Rundell, Peter W. K. Kernel estimates for categorical data. (English) Zbl 0611.62058 Technometrics 27, 293-299 (1985). MSC: 62H12 62H30 62H17 62G05 PDFBibTeX XMLCite \textit{P. J. Brown} and \textit{P. W. K. Rundell}, Technometrics 27, 293--299 (1985; Zbl 0611.62058) Full Text: DOI
Sandford, Martin D. Nonparametric one-sided confidence intervals for an unknown distribution function using censored data. (English) Zbl 0558.62041 Technometrics 27, 41-48 (1985). MSC: 62G15 62Q05 PDFBibTeX XMLCite \textit{M. D. Sandford}, Technometrics 27, 41--48 (1985; Zbl 0558.62041) Full Text: DOI
Brain, Carlos W.; Shapiro, Samuel S. A regression test for exponentiality: Censored and complete samples. (English) Zbl 0504.62025 Technometrics 25, 69-76 (1983). MSC: 62F03 65C05 62G10 PDFBibTeX XMLCite \textit{C. W. Brain} and \textit{S. S. Shapiro}, Technometrics 25, 69--76 (1983; Zbl 0504.62025) Full Text: DOI
Skillings, John H.; Mack, Gregory A. On the use of a Friedman-type statistic in balanced and unbalanced block designs. (English) Zbl 0478.62060 Technometrics 23, 171-177 (1981). MSC: 62K10 62G10 PDFBibTeX XMLCite \textit{J. H. Skillings} and \textit{G. A. Mack}, Technometrics 23, 171--177 (1981; Zbl 0478.62060) Full Text: DOI
Gans, Daniel J. Corrected and extended tables for Tukey’s quick test. (English) Zbl 0475.62090 Technometrics 23, 193-195 (1981). MSC: 62Q05 62G10 PDFBibTeX XMLCite \textit{D. J. Gans}, Technometrics 23, 193--195 (1981; Zbl 0475.62090) Full Text: DOI
Engelhardt, Max; Bain, Lee J.; Wright, F. T. Inferences on the parameters of the Birnbaum-Saunders fatigue life distribution based on maximum likelihood estimation. (English) Zbl 0462.62077 Technometrics 23, 251-256 (1981). MSC: 62N05 62G15 62E20 62G10 PDFBibTeX XMLCite \textit{M. Engelhardt} et al., Technometrics 23, 251--256 (1981; Zbl 0462.62077) Full Text: DOI
Saxena, K. M. Lal Distribution-free tolerance bounds for the lifetime of an m-out-of-k system of components. (English) Zbl 0457.62080 Technometrics 23, 97-103 (1981). MSC: 62N05 62F25 62G99 PDFBibTeX XMLCite \textit{K. M. L. Saxena}, Technometrics 23, 97--103 (1981; Zbl 0457.62080) Full Text: DOI
Skillings, John H. On the null distribution of Jonckheere’s statistic used in two-way models for ordered alternatives. (English) Zbl 0465.62019 Technometrics 22, 431-436 (1980). MSC: 62E15 62G10 62Q05 PDFBibTeX XMLCite \textit{J. H. Skillings}, Technometrics 22, 431--436 (1980; Zbl 0465.62019) Full Text: DOI
Kubat, Peter; Epstein, Benjamin Estimation of quantiles of location-scale distributions based on two or three order statistics. (English) Zbl 0455.62029 Technometrics 22, 575-581 (1980). MSC: 62G05 62G30 62F10 PDFBibTeX XMLCite \textit{P. Kubat} and \textit{B. Epstein}, Technometrics 22, 575--581 (1980; Zbl 0455.62029) Full Text: DOI
Lee, S. C. S.; Locke, Charles; Spurrier, John D. On a class of tests of exponentiality. (English) Zbl 0454.62088 Technometrics 22, 547-554 (1980). MSC: 62N05 62F03 65C05 62G10 PDFBibTeX XMLCite \textit{S. C. S. Lee} et al., Technometrics 22, 547--554 (1980; Zbl 0454.62088) Full Text: DOI
Titterington, D. M. A comparative study of kernel-based density estimates for categorical data. (English) Zbl 0441.62036 Technometrics 22, 259-268 (1980). MSC: 62G05 PDFBibTeX XMLCite \textit{D. M. Titterington}, Technometrics 22, 259--268 (1980; Zbl 0441.62036) Full Text: DOI
Salvia, Anthony A. Some fundamental properties of Kolmogorov-Smirnov consonance sets. (English) Zbl 0438.62038 Technometrics 22, 109-111 (1980). MSC: 62G10 62G15 PDFBibTeX XMLCite \textit{A. A. Salvia}, Technometrics 22, 109--111 (1980; Zbl 0438.62038) Full Text: DOI
Chan, Lai K.; Rhodin, Lennart S. Robust estimation of location using optimally chosen sample quantiles. (English) Zbl 0428.62031 Technometrics 22, 225-237 (1980). MSC: 62F35 62G30 PDFBibTeX XMLCite \textit{L. K. Chan} and \textit{L. S. Rhodin}, Technometrics 22, 225--237 (1980; Zbl 0428.62031) Full Text: DOI
Gaver, Donald P.; Chu, Boyer B. Jackknife estimates of component and system availability. (English) Zbl 0424.62069 Technometrics 21, 443-450 (1979). MSC: 62N05 62G99 PDFBibTeX XMLCite \textit{D. P. Gaver} and \textit{B. B. Chu}, Technometrics 21, 443--450 (1979; Zbl 0424.62069) Full Text: DOI
Zidek, James V.; Navin, Francis P. D.; Lockhart, Richard Statistics of extremes: An alternate method with application to bridge design codes. (English) Zbl 0423.62076 Technometrics 21, 185-191 (1979). MSC: 62N05 62G30 PDFBibTeX XMLCite \textit{J. V. Zidek} et al., Technometrics 21, 185--191 (1979; Zbl 0423.62076) Full Text: DOI
Michael, John R.; Schucany, William R. A new approach to testing goodness of fit for censored samples. (English) Zbl 0423.62033 Technometrics 21, 435-441 (1979). MSC: 62G10 62G30 PDFBibTeX XMLCite \textit{J. R. Michael} and \textit{W. R. Schucany}, Technometrics 21, 435--441 (1979; Zbl 0423.62033) Full Text: DOI
Lewis, T.; Fieller, N. R. J. A recursive algorithm for null distributions for outliers: I. Gamma samples. (English) Zbl 0419.62039 Technometrics 21, 371-376 (1979). MSC: 62G10 62G30 62F03 PDFBibTeX XMLCite \textit{T. Lewis} and \textit{N. R. J. Fieller}, Technometrics 21, 371--376 (1979; Zbl 0419.62039) Full Text: DOI
Choi, S. C. Two-sample tests for compound distributions for homogeneity of mixing proportions. (English) Zbl 0417.62076 Technometrics 21, 361-365 (1979). MSC: 62N05 62G10 62F03 62F10 65C05 PDFBibTeX XMLCite \textit{S. C. Choi}, Technometrics 21, 361--365 (1979; Zbl 0417.62076) Full Text: DOI
Dufour, R.; Maag, U. R. Distribution results for modified Kolmogorov-Smirnov statistics for truncated or censored samples. (English) Zbl 0397.62026 Technometrics 20, 29-32 (1978). MSC: 62G10 62E20 PDFBibTeX XMLCite \textit{R. Dufour} and \textit{U. R. Maag}, Technometrics 20, 29--32 (1978; Zbl 0397.62026) Full Text: DOI
Samuels, S. M. The exact solution to the two-stage group-testing problem. (English) Zbl 0397.60022 Technometrics 20, 497-500 (1978). MSC: 60C05 62G10 PDFBibTeX XMLCite \textit{S. M. Samuels}, Technometrics 20, 497--500 (1978; Zbl 0397.60022) Full Text: DOI
Rosner, Bernard Percentage points for the RST many outlier procedure. (English) Zbl 0389.62026 Technometrics 19, 307-312 (1977). MSC: 62G05 PDFBibTeX XMLCite \textit{B. Rosner}, Technometrics 19, 307--312 (1977; Zbl 0389.62026) Full Text: DOI
Pettitt, A. N.; Stephens, M. A. The Kolmogorov-Smirnov goodness-of-fit statistic with discrete and grouped data. (English) Zbl 0381.62036 Technometrics 19, 205-210 (1977). MSC: 62G10 62E15 PDFBibTeX XMLCite \textit{A. N. Pettitt} and \textit{M. A. Stephens}, Technometrics 19, 205--210 (1977; Zbl 0381.62036) Full Text: DOI
Breiman, Leo; Meisel, William; Purcell, Edward Variable kernel estimates of multivariate densities. (English) Zbl 0379.62023 Technometrics 19, 135-144 (1977). MSC: 62G05 62H10 PDFBibTeX XMLCite \textit{L. Breiman} et al., Technometrics 19, 135--144 (1977; Zbl 0379.62023) Full Text: DOI
Guenther, William C. An easy method for obtaining percentage points of order statistics. (English) Zbl 0371.62069 Technometrics 19, 319-321 (1977). MSC: 62G30 PDFBibTeX XMLCite \textit{W. C. Guenther}, Technometrics 19, 319--321 (1977; Zbl 0371.62069) Full Text: DOI
Hettmansperger, Thomas P.; McKean, Joseph W. A robust alternative based on ranks to least squares in analyzing linear models. (English) Zbl 0369.62052 Technometrics 19, 275-284 (1977). MSC: 62G35 62J05 62J10 62G10 62G05 PDFBibTeX XMLCite \textit{T. P. Hettmansperger} and \textit{J. W. McKean}, Technometrics 19, 275--284 (1977; Zbl 0369.62052) Full Text: DOI
Hahn, Gerald J. A prediction interval on the difference between two future sample means and its application to a claim of product superiority. (English) Zbl 0364.62075 Technometrics 19, 131-134 (1977). MSC: 62J15 62G15 PDFBibTeX XMLCite \textit{G. J. Hahn}, Technometrics 19, 131--134 (1977; Zbl 0364.62075) Full Text: DOI
LaBrecque, John Goodness-of-fit tests based on nonlinearity in probability plots. (English) Zbl 0364.62044 Technometrics 19, 293-306 (1977). MSC: 62G10 PDFBibTeX XMLCite \textit{J. LaBrecque}, Technometrics 19, 293--306 (1977; Zbl 0364.62044) Full Text: DOI
Moussa-Hamouda, Effat; Leone, Fred C. The robustness of efficiency of adjusted trimmed estimators in linear regression. (English) Zbl 0352.62063 Technometrics 19, 19-34 (1977). MSC: 62J05 62G35 PDFBibTeX XMLCite \textit{E. Moussa-Hamouda} and \textit{F. C. Leone}, Technometrics 19, 19--34 (1977; Zbl 0352.62063) Full Text: DOI
Mann, Nancy R.; Fertig, Kenneth W. Efficient unbiased quantile estimators for moderate-size complete samples from extreme-value and Weibull distributions; confidence bounds and tolerance and prediction intervals. (English) Zbl 0352.62037 Technometrics 19, 87-93 (1977). MSC: 62G05 62G15 PDFBibTeX XMLCite \textit{N. R. Mann} and \textit{K. W. Fertig}, Technometrics 19, 87--93 (1977; Zbl 0352.62037) Full Text: DOI
Woodward, Wayne A.; Kelley, Gary D. Minimum variance unbiased estimation of \(P[Y<X]\) in the normal case. (English) Zbl 0352.62036 Technometrics 19, 95-98 (1977). MSC: 62G05 PDFBibTeX XMLCite \textit{W. A. Woodward} and \textit{G. D. Kelley}, Technometrics 19, 95--98 (1977; Zbl 0352.62036) Full Text: DOI
Beyer, Jon N.; Moore, Albert H.; Harter, H. Leon Estimation of the standard deviation of the logistic distribution by the use of selected order statistics. (English) Zbl 0342.62015 Technometrics 18, 313-332 (1976). MSC: 62F10 62G30 PDFBibTeX XMLCite \textit{J. N. Beyer} et al., Technometrics 18, 313--332 (1976; Zbl 0342.62015) Full Text: DOI
Ng, Vee Ming A note on the best test for discrimination between exponentiality and uniformity. (English) Zbl 0341.62021 Technometrics 18, 237-238 (1976). MSC: 62F03 62G10 PDFBibTeX XMLCite \textit{V. M. Ng}, Technometrics 18, 237--238 (1976; Zbl 0341.62021) Full Text: DOI
Low, Leone Y. Some properties of variance component estimators in the two-way classification. (English) Zbl 0332.62052 Technometrics 18, 39-46 (1976). MSC: 62J10 62F10 62K10 62B15 62G05 PDFBibTeX XMLCite \textit{L. Y. Low}, Technometrics 18, 39--46 (1976; Zbl 0332.62052) Full Text: DOI
Cohen, A. Clifford Progressively censored sampling in the three parameter log-normal distribution. (English) Zbl 0331.62025 Technometrics 18, 99-103 (1976). MSC: 62F10 62G30 62N05 PDFBibTeX XMLCite \textit{A. C. Cohen}, Technometrics 18, 99--103 (1976; Zbl 0331.62025) Full Text: DOI
Easterling, Robert G. Goodness of fit and parameter estimation. (English) Zbl 0322.62035 Technometrics 18, 1-9 (1976). MSC: 62F10 62G10 PDFBibTeX XMLCite \textit{R. G. Easterling}, Technometrics 18, 1--9 (1976; Zbl 0322.62035) Full Text: DOI
Koziol, James A.; Byar, David P. Percentage points of the asymptotic distributions of one and two sample K-S statistics for truncated or censored data. (English) Zbl 0326.62032 Technometrics 17, 507-510 (1975). MSC: 62G10 62Q05 PDFBibTeX XMLCite \textit{J. A. Koziol} and \textit{D. P. Byar}, Technometrics 17, 507--510 (1975; Zbl 0326.62032) Full Text: DOI
Hogg, Robert V.; Randles, Ronald H. Adaptive distribution-free regression methods and their applications. (English) Zbl 0324.62051 Technometrics 17, 399-407 (1975). MSC: 62J05 65C05 62G05 62G10 PDFBibTeX XMLCite \textit{R. V. Hogg} and \textit{R. H. Randles}, Technometrics 17, 399--407 (1975; Zbl 0324.62051) Full Text: DOI
Woodruff, H. B.; Ritter, G. L.; Lowry, S. R.; Isenhour, T. L. Density estimations and the characterization of binary infrared spectra. (English) Zbl 0322.62044 Technometrics 17, 455-462 (1975). MSC: 62G05 68T10 62H30 PDFBibTeX XMLCite \textit{H. B. Woodruff} et al., Technometrics 17, 455--462 (1975; Zbl 0322.62044) Full Text: DOI
Mann, Nancy R.; Fertig, Kenneth W. A goodness-of-fit test for the two parameter vs. three parameter Weibull; confidence bounds for threshold. (English) Zbl 0308.62035 Technometrics 17, 237-245 (1975). MSC: 62G10 62N05 62E15 62G15 PDFBibTeX XMLCite \textit{N. R. Mann} and \textit{K. W. Fertig}, Technometrics 17, 237--245 (1975; Zbl 0308.62035) Full Text: DOI
McGilchrist, C. A.; Woodyer, K. D. Note on a distribution-free CUSUM technique. (English) Zbl 0307.62035 Technometrics 17, 321-325 (1975). MSC: 62G10 62N99 PDFBibTeX XMLCite \textit{C. A. McGilchrist} and \textit{K. D. Woodyer}, Technometrics 17, 321--325 (1975; Zbl 0307.62035) Full Text: DOI
Weisberg, Sanford; Bingham, Christopher An approximate analysis of variance test for non-normality suitable for machine calculation. (English) Zbl 0295.62075 Technometrics 17, 133-134 (1975). MSC: 62J10 62G30 PDFBibTeX XMLCite \textit{S. Weisberg} and \textit{C. Bingham}, Technometrics 17, 133--134 (1975; Zbl 0295.62075) Full Text: DOI
Filliben, James J. The probability plot correlation coefficient test for normality. (English) Zbl 0295.62049 Technometrics 17, 111-117 (1975). MSC: 62G10 62H20 62Q05 62F03 PDFBibTeX XMLCite \textit{J. J. Filliben}, Technometrics 17, 111--117 (1975; Zbl 0295.62049) Full Text: DOI
Yuen, Karen K.; Murthy, V. K. Percentage points of the distribution of the t statistic when the parent is Student’s t. (English) Zbl 0305.62032 Technometrics 16, 495-497 (1974). MSC: 62G35 62Q05 PDFBibTeX XMLCite \textit{K. K. Yuen} and \textit{V. K. Murthy}, Technometrics 16, 495--497 (1974; Zbl 0305.62032) Full Text: DOI
Andrews, D. F. A robust method for multiple linear regression. (English) Zbl 0294.62082 Technometrics 16, 523-531 (1974). MSC: 62J05 62G35 PDFBibTeX XMLCite \textit{D. F. Andrews}, Technometrics 16, 523--531 (1974; Zbl 0294.62082) Full Text: DOI
Moussa-Hamouda, Effat; Leone, Fred C. The O-BLUE estimators for complete and censored samples in linear regression. (English) Zbl 0285.62043 Technometrics 16, 441-446 (1974). MSC: 62J05 62G30 PDFBibTeX XMLCite \textit{E. Moussa-Hamouda} and \textit{F. C. Leone}, Technometrics 16, 441--446 (1974; Zbl 0285.62043) Full Text: DOI
Guenther, William C. Sample size formulas for some binomial type problems. (English) Zbl 0285.62007 Technometrics 16, 465-467 (1974). MSC: 62E15 62F03 62G15 PDFBibTeX XMLCite \textit{W. C. Guenther}, Technometrics 16, 465--467 (1974; Zbl 0285.62007) Full Text: DOI
Likes, J. Prediction of s-th ordered observation for the two-parameter exponential distribution. (English) Zbl 0282.62023 Technometrics 16, 241-244 (1974). MSC: 62F25 62G30 PDFBibTeX XMLCite \textit{J. Likes}, Technometrics 16, 241--244 (1974; Zbl 0282.62023) Full Text: DOI
Kaminsky, Kenneth S. Confidence intervals and tests for two exponential scale parameters based on order statistics in compressed samples. (English) Zbl 0282.62022 Technometrics 16, 251-254 (1974). MSC: 62F03 62F25 62N05 62G30 PDFBibTeX XMLCite \textit{K. S. Kaminsky}, Technometrics 16, 251--254 (1974; Zbl 0282.62022) Full Text: DOI
Kaminsky, Kenneth S.; Nelson, Paul I. Prediction intervals for the exponential distribution using subsets of the data. (English) Zbl 0277.62014 Technometrics 16, 57-59 (1974). MSC: 62E15 62N05 62F25 62G30 PDFBibTeX XMLCite \textit{K. S. Kaminsky} and \textit{P. I. Nelson}, Technometrics 16, 57--59 (1974; Zbl 0277.62014) Full Text: DOI
Mielke, Paul W. jun. Squared rank test appropriate to weather modification cross-over design. (English) Zbl 0276.62043 Technometrics 16, 13-16 (1974). MSC: 62G10 62E15 62G20 62E10 PDFBibTeX XMLCite \textit{P. W. Mielke jun.}, Technometrics 16, 13--16 (1974; Zbl 0276.62043) Full Text: DOI
Brown, Morton B.; Forsythe, Alan B. The small sample behavior of some statistics which test the equality of several means. (English) Zbl 0275.62047 Technometrics 16, 129-132 (1974). MSC: 62F03 62H15 62G35 PDFBibTeX XMLCite \textit{M. B. Brown} and \textit{A. B. Forsythe}, Technometrics 16, 129--132 (1974; Zbl 0275.62047) Full Text: DOI
Barr, Donald R.; Davidson, Teddy A Kolmogorov-Smirnov test for censored samples. (English) Zbl 0271.62055 Technometrics 15, 739-757 (1973). MSC: 62G10 62Q05 PDFBibTeX XMLCite \textit{D. R. Barr} and \textit{T. Davidson}, Technometrics 15, 739--757 (1973; Zbl 0271.62055) Full Text: DOI
Chase, Gerald R.; Hewett, John E. On testing for equality of two availabilities. (English) Zbl 0269.62041 Technometrics 15, 889-896 (1973). MSC: 65C05 62G10 PDFBibTeX XMLCite \textit{G. R. Chase} and \textit{J. E. Hewett}, Technometrics 15, 889--896 (1973; Zbl 0269.62041) Full Text: DOI
Moran, M. A.; McMillan, R. G. Tests for one or two outliers in normal samples with unknown variance: a correction. (English) Zbl 0261.62018 Technometrics 15, 637-640 (1973). MSC: 62G99 62F03 PDFBibTeX XMLCite \textit{M. A. Moran} and \textit{R. G. McMillan}, Technometrics 15, 637--640 (1973; Zbl 0261.62018) Full Text: DOI
Brillinger, David R. A power spectral estimate which is insensitive to transients. (English) Zbl 0259.62075 Technometrics 15, 559-562 (1973). MSC: 62M15 62G35 PDFBibTeX XMLCite \textit{D. R. Brillinger}, Technometrics 15, 559--562 (1973; Zbl 0259.62075) Full Text: DOI
Choi, S. C. On nonparametric sequential tests for independence. (English) Zbl 0259.62038 Technometrics 15, 625-629 (1973). MSC: 65C05 62G10 62L10 PDFBibTeX XMLCite \textit{S. C. Choi}, Technometrics 15, 625--629 (1973; Zbl 0259.62038) Full Text: DOI
Dyer, D. D. Estimation of the scale parameter of the chi distribution based on sample quantiles. (English) Zbl 0259.62024 Technometrics 15, 489-496 (1973). MSC: 62F10 62G30 PDFBibTeX XMLCite \textit{D. D. Dyer}, Technometrics 15, 489--496 (1973; Zbl 0259.62024) Full Text: DOI
Wegman, Edward J. Nonparametric probability density estimation. I: A summary of available methods. (English) Zbl 0243.62028 Technometrics 14, 533-546 (1972). MSC: 62G05 PDFBibTeX XMLCite \textit{E. J. Wegman}, Technometrics 14, 533--546 (1972; Zbl 0243.62028) Full Text: DOI
Thomas, David R.; Wilson, Wanda M. Linear order statistic estimation for the two-parameter Weibull and extreme-value distributions from type II progressively censored samples. (English) Zbl 0238.62061 Technometrics 14, 679-691 (1972). MSC: 62G30 PDFBibTeX XMLCite \textit{D. R. Thomas} and \textit{W. M. Wilson}, Technometrics 14, 679--691 (1972; Zbl 0238.62061) Full Text: DOI
Ury, Hans K. On distribution-free confidence bounds for \(Pr\{Y<X\}\). (English) Zbl 0237.62038 Technometrics 14, 577-581 (1972). MSC: 62G15 PDFBibTeX XMLCite \textit{H. K. Ury}, Technometrics 14, 577--581 (1972; Zbl 0237.62038) Full Text: DOI
Tarter, Michael E.; Kowalski, Charles J. A new test for and class of transformations to normality. (English) Zbl 0237.62034 Technometrics 14, 735-744 (1972). MSC: 62G05 PDFBibTeX XMLCite \textit{M. E. Tarter} and \textit{C. J. Kowalski}, Technometrics 14, 735--744 (1972; Zbl 0237.62034) Full Text: DOI
Odeh, Robert E. On Jonckheere’s k-sample test against ordered alternatives. (English) Zbl 0222.62014 Technometrics 13, 912-918 (1971). MSC: 62G10 PDFBibTeX XMLCite \textit{R. E. Odeh}, Technometrics 13, 912--918 (1971; Zbl 0222.62014) Full Text: DOI
Bhattacharyya, G. K.; Johnson, R. A.; Neave, H. R. A comparative power study of the bivariate rank sum test and \(T^ 2\). (English) Zbl 0218.62042 Technometrics 13, 191-198 (1971). MSC: 62G10 PDFBibTeX XMLCite \textit{G. K. Bhattacharyya} et al., Technometrics 13, 191--198 (1971; Zbl 0218.62042) Full Text: DOI
Specht, D. F. Series estimation of a probability density function. (English) Zbl 0218.62038 Technometrics 13, 409-424 (1971). MSC: 62G05 PDFBibTeX XMLCite \textit{D. F. Specht}, Technometrics 13, 409--424 (1971; Zbl 0218.62038) Full Text: DOI
Mann, Nancy R. Estimators and exact confidence bounds for Weibull parameters based on a few ordered observations. (English) Zbl 0267.62015 Technometrics 12, 345-361 (1970). MSC: 62F10 62F25 62G30 PDFBibTeX XMLCite \textit{N. R. Mann}, Technometrics 12, 345--361 (1970; Zbl 0267.62015) Full Text: DOI
Jaech, John L. Comparing two methods of obtaining a confidence interval for the ratio of Poisson parameters. (English) Zbl 0203.51303 Technometrics 12, 383-387 (1970). MSC: 62G15 PDFBibTeX XMLCite \textit{J. L. Jaech}, Technometrics 12, 383--387 (1970; Zbl 0203.51303) Full Text: DOI
Gupta, Shanti S. Order statistics from the gamma distribution. (English) Zbl 0236.62035 Technometrics 2, 243-262 (1960). MSC: 62G30 PDFBibTeX XMLCite \textit{S. S. Gupta}, Technometrics 2, 243--262 (1960; Zbl 0236.62035) Full Text: DOI