Bagci, Eyup Corrigendum to “Reverse engineering applications for recovery of broken or worn parts and re-manufacturing: three case studies”. (English) Zbl 1283.68384 Adv. Eng. Softw. 42, No. 1-2, 55 (2011). MSC: 68U07 PDF BibTeX XML Cite \textit{E. Bagci}, Adv. Eng. Softw. 42, No. 1--2, 55 (2011; Zbl 1283.68384) Full Text: DOI
Kim, Changsoo; Yoon, Sungroh; Kim, Dongseung Fast sort of floating-point data for data engineering. (English) Zbl 1210.68051 Adv. Eng. Softw. 42, No. 1-2, 50-54 (2011). MSC: 68P10 68W05 PDF BibTeX XML Cite \textit{C. Kim} et al., Adv. Eng. Softw. 42, No. 1--2, 50--54 (2011; Zbl 1210.68051) Full Text: DOI
Azamatov, Abdulaziz; Lee, Jae-Woo; Byun, Yung-Hwan Comprehensive aircraft configuration design tool for integrated product and process development. (English) Zbl 1206.65044 Adv. Eng. Softw. 42, No. 1-2, 35-49 (2011). MSC: 65D17 65K10 49Q10 76G25 PDF BibTeX XML Cite \textit{A. Azamatov} et al., Adv. Eng. Softw. 42, No. 1--2, 35--49 (2011; Zbl 1206.65044) Full Text: DOI
Chang, Hsien-Kuo; Liou, Jin-Cheng; Liu, Shen-Jung; Liaw, Shyne-Ruey Simulated wave-driven ANN model for typhoon waves. (English) Zbl 1283.76051 Adv. Eng. Softw. 42, No. 1-2, 25-34 (2011). MSC: 76M25 76L05 PDF BibTeX XML Cite \textit{H.-K. Chang} et al., Adv. Eng. Softw. 42, No. 1--2, 25--34 (2011; Zbl 1283.76051) Full Text: DOI
Rama Chandra Murthy, A.; Palani, G. S.; Iyer, Nagesh R. Object-oriented programming paradigm for damage tolerant evaluation of engineering structural components. (English) Zbl 1283.74098 Adv. Eng. Softw. 42, No. 1-2, 12-24 (2011). MSC: 74S30 74R99 PDF BibTeX XML Cite \textit{A. Rama Chandra Murthy} et al., Adv. Eng. Softw. 42, No. 1--2, 12--24 (2011; Zbl 1283.74098) Full Text: DOI
Sakalkar, Varun; Hajela, Prabhat Multilevel decomposition based nondeterministic design optimization for structural systems. (English) Zbl 1283.74047 Adv. Eng. Softw. 42, No. 1-2, 1-11 (2011). MSC: 74P05 PDF BibTeX XML Cite \textit{V. Sakalkar} and \textit{P. Hajela}, Adv. Eng. Softw. 42, No. 1--2, 1--11 (2011; Zbl 1283.74047) Full Text: DOI