Ben-Bassat, Moshe; Klove, Karin L.; Weil, Max H. Sensitivity analysis in Bayesian classification models: Multiplicative deviations. (English) Zbl 0465.62050 IEEE Trans. Pattern Anal. Mach. Intell. 2, 261-266 (1980). Page: −5 −4 −3 −2 −1 ±0 +1 +2 +3 +4 +5 Show Scanned Page Cited in 1 Document MSC: 62H30 Classification and discrimination; cluster analysis (statistical aspects) 68T10 Pattern recognition, speech recognition 62P10 Applications of statistics to biology and medical sciences; meta analysis 62C10 Bayesian problems; characterization of Bayes procedures Keywords:sensitivity analysis; Bayesian classification models; multiplicative deviations; medical diagnosis; pattern recognition; prior probabilities PDFBibTeX XMLCite \textit{M. Ben-Bassat} et al., IEEE Trans. Pattern Anal. Mach. Intell. 2, 261--266 (1980; Zbl 0465.62050) Full Text: DOI