Escarela, Gabriel; Carriére, Jacques F. A bivariate model of claim frequencies and severities. (English) Zbl 1119.62368 J. Appl. Stat. 33, No. 8, 867-883 (2006). MSC: 62P05 PDFBibTeX XMLCite \textit{G. Escarela} and \textit{J. F. Carriére}, J. Appl. Stat. 33, No. 8, 867--883 (2006; Zbl 1119.62368) Full Text: DOI
Lee, Seong-Keon; Jin, Seohoon Decision tree approaches for zero-inflated count data. (English) Zbl 1119.62303 J. Appl. Stat. 33, No. 8, 853-865 (2006). MSC: 62P99 PDFBibTeX XMLCite \textit{S.-K. Lee} and \textit{S. Jin}, J. Appl. Stat. 33, No. 8, 853--865 (2006; Zbl 1119.62303) Full Text: DOI
Wang, Jixian Optimal parametric design with applications to pharmacokinetic and pharmacodynamic trials. (English) Zbl 1119.62353 J. Appl. Stat. 33, No. 8, 837-852 (2006). MSC: 62K05 62P10 PDFBibTeX XMLCite \textit{J. Wang}, J. Appl. Stat. 33, No. 8, 837--852 (2006; Zbl 1119.62353) Full Text: DOI
Ayuga Téllez, E.; Martín Fernández, A. J.; González García, C.; Martínez Falero, E. Estimation of non-parametric regression for dasometric measures. (English) Zbl 1119.62329 J. Appl. Stat. 33, No. 8, 819-836 (2006). MSC: 62G08 62F10 PDFBibTeX XMLCite \textit{E. Ayuga Téllez} et al., J. Appl. Stat. 33, No. 8, 819--836 (2006; Zbl 1119.62329) Full Text: DOI
Chiang, Yuang-Chin; Chen, Lin-An; Yang, Hsien-Chueh Peter Symmetric quantiles and their applications. (English) Zbl 1119.62314 J. Appl. Stat. 33, No. 8, 807-817 (2006). MSC: 62F10 62G05 62J05 PDFBibTeX XMLCite \textit{Y.-C. Chiang} et al., J. Appl. Stat. 33, No. 8, 807--817 (2006; Zbl 1119.62314) Full Text: DOI
Ismail, Sanaa A.; Auda, Hesham A. Bayesian and fiducial inference for the inverse Gaussian distribution via Gibbs sampler. (English) Zbl 1119.62319 J. Appl. Stat. 33, No. 8, 787-805 (2006). MSC: 62F15 65C60 PDFBibTeX XMLCite \textit{S. A. Ismail} and \textit{H. A. Auda}, J. Appl. Stat. 33, No. 8, 787--805 (2006; Zbl 1119.62319) Full Text: DOI
Cooper, Tony; Leitnaker, Mary G. Further exploratory analysis of split-plot experiments to study certain stratified effects. (English) Zbl 1119.62355 J. Appl. Stat. 33, No. 8, 773-786 (2006). MSC: 62K99 PDFBibTeX XMLCite \textit{T. Cooper} and \textit{M. G. Leitnaker}, J. Appl. Stat. 33, No. 8, 773--786 (2006; Zbl 1119.62355) Full Text: DOI
Chen, Wen-Den Testing for spurious regression in a panel data model with the individual number and time length growing. (English) Zbl 1119.62357 J. Appl. Stat. 33, No. 8, 759-772 (2006). MSC: 62M10 62F03 65C05 PDFBibTeX XMLCite \textit{W.-D. Chen}, J. Appl. Stat. 33, No. 8, 759--772 (2006; Zbl 1119.62357) Full Text: DOI