Dölz, Jürgen; Harbrecht, Helmut; Jerez-Hanckes, Carlos; Multerer, Michael Isogeometric multilevel quadrature for forward and inverse random acoustic scattering. (English) Zbl 1507.74529 Comput. Methods Appl. Mech. Eng. 388, Article ID 114242, 18 p. (2022). MSC: 74S15 65N38 65D32 74J20 76Q05 PDFBibTeX XMLCite \textit{J. Dölz} et al., Comput. Methods Appl. Mech. Eng. 388, Article ID 114242, 18 p. (2022; Zbl 1507.74529) Full Text: DOI arXiv
Escapil-Inchauspé, Paul; Jerez-Hanckes, Carlos Helmholtz scattering by random domains: first-order sparse boundary element approximation. (English) Zbl 07271922 SIAM J. Sci. Comput. 42, No. 5, A2561-A2592 (2020). MSC: 47A40 35J25 49Q12 PDFBibTeX XMLCite \textit{P. Escapil-Inchauspé} and \textit{C. Jerez-Hanckes}, SIAM J. Sci. Comput. 42, No. 5, A2561--A2592 (2020; Zbl 07271922) Full Text: DOI arXiv
Aylwin, Ruben; Jerez-Hanckes, Carlos; Schwab, Christoph; Zech, Jakob Domain uncertainty quantification in computational electromagnetics. (English) Zbl 1483.65010 SIAM/ASA J. Uncertain. Quantif. 8, 301-341 (2020). MSC: 65C05 62F15 83C50 65N30 PDFBibTeX XMLCite \textit{R. Aylwin} et al., SIAM/ASA J. Uncertain. Quantif. 8, 301--341 (2020; Zbl 1483.65010) Full Text: DOI
Fuenzalida, Consuelo; Jerez-Hanckes, Carlos; McClarren, Ryan G. Uncertainty quantification for multigroup diffusion equations using sparse tensor approximations. (English) Zbl 1421.82049 SIAM J. Sci. Comput. 41, No. 3, B545-B575 (2019). MSC: 82D75 65M60 35R60 65C50 82C80 PDFBibTeX XMLCite \textit{C. Fuenzalida} et al., SIAM J. Sci. Comput. 41, No. 3, B545--B575 (2019; Zbl 1421.82049) Full Text: DOI
Jerez-Hanckes, Carlos; Schwab, Christoph; Zech, Jakob Electromagnetic wave scattering by random surfaces: shape holomorphy. (English) Zbl 1381.35170 Math. Models Methods Appl. Sci. 27, No. 12, 2229-2259 (2017). Reviewer: Eric Stachura (Haverford) MSC: 35Q61 35A20 35B30 32D05 78A45 78A46 35A02 78A48 PDFBibTeX XMLCite \textit{C. Jerez-Hanckes} et al., Math. Models Methods Appl. Sci. 27, No. 12, 2229--2259 (2017; Zbl 1381.35170) Full Text: DOI