Vexler, Albert; Shan, Guogen; Kim, Seongeun; Tsai, Wan-Min; Tian, Lili; Hutson, Alan D. An empirical likelihood ratio based goodness-of-fit test for inverse Gaussian distributions. (English) Zbl 1208.62078 J. Stat. Plann. Inference 141, No. 6, 2128-2140 (2011). MSC: 62G10 62G20 62F03 65C05 PDFBibTeX XMLCite \textit{A. Vexler} et al., J. Stat. Plann. Inference 141, No. 6, 2128--2140 (2011; Zbl 1208.62078) Full Text: DOI
Mudholkar, Govind S.; Tian, Lili On the null distributions of the entropy tests for the Gaussian and inverse Gaussian models. (English) Zbl 1108.62306 Commun. Stat., Theory Methods 31, No. 2, 311-324 (2002). MSC: 62E15 62B10 65C05 PDFBibTeX XMLCite \textit{G. S. Mudholkar} and \textit{L. Tian}, Commun. Stat., Theory Methods 31, No. 2, 311--324 (2002; Zbl 1108.62306) Full Text: DOI
Mudholkar, Govind S.; Tian, Lili An entropy characterization of the inverse Gaussian distribution and related goodness-of-fit test. (English) Zbl 0989.62011 J. Stat. Plann. Inference 102, No. 2, 211-221 (2002). MSC: 62E10 62B10 62G10 62G05 PDFBibTeX XMLCite \textit{G. S. Mudholkar} and \textit{L. Tian}, J. Stat. Plann. Inference 102, No. 2, 211--221 (2002; Zbl 0989.62011) Full Text: DOI