Chatterjee, S.; Singh, J. B.; Roy, Arunava; Shukla, Ankur NHPP-based software reliability growth modeling and optimal release policy for N-version programming system with increasing fault detection rate under imperfect debugging. (English) Zbl 1448.60178 Proc. Natl. Acad. Sci. India, Sect. A, Phys. Sci. 90, No. 1, 11-26 (2020). MSC: 60K10 62N02 90B25 94C12 PDFBibTeX XMLCite \textit{S. Chatterjee} et al., Proc. Natl. Acad. Sci. India, Sect. A, Phys. Sci. 90, No. 1, 11--26 (2020; Zbl 1448.60178) Full Text: DOI
Khan, M. G. M.; Ahmad, N.; Rafi, L. S. Determining the optimal allocation of testing resource for modular software system using dynamic programming. (English) Zbl 1345.90002 Commun. Stat., Theory Methods 45, No. 3, 670-694 (2016). MSC: 90-08 90C30 90C39 91B32 68N99 PDFBibTeX XMLCite \textit{M. G. M. Khan} et al., Commun. Stat., Theory Methods 45, No. 3, 670--694 (2016; Zbl 1345.90002) Full Text: DOI
Pachauri, Bhoopendra; Dhar, Joydip; Kumar, Ajay Incorporating inflection S-shaped fault reduction factor to enhance software reliability growth. (English) Zbl 1443.68042 Appl. Math. Modelling 39, No. 5-6, 1463-1469 (2015). MSC: 68N99 PDFBibTeX XMLCite \textit{B. Pachauri} et al., Appl. Math. Modelling 39, No. 5--6, 1463--1469 (2015; Zbl 1443.68042) Full Text: DOI
Chatterjee, Subhashis; Singh, Jeetendra B.; Roy, Arunava A structure-based software reliability allocation using fuzzy analytic hierarchy process. (English) Zbl 1331.68049 Int. J. Syst. Sci., Princ. Appl. Syst. Integr. 46, No. 3, 513-525 (2015). MSC: 68N30 PDFBibTeX XMLCite \textit{S. Chatterjee} et al., Int. J. Syst. Sci., Princ. Appl. Syst. Integr. 46, No. 3, 513--525 (2015; Zbl 1331.68049) Full Text: DOI
Kapur, P. K.; Pham, Hoang; Chanda, Udayan; Kumar, Vijay Optimal allocation of testing effort during testing and debugging phases: a control theoretic approach. (English) Zbl 1278.93290 Int. J. Syst. Sci. 44, No. 9, 1639-1650 (2013). MSC: 93E20 93C95 93C83 PDFBibTeX XMLCite \textit{P. K. Kapur} et al., Int. J. Syst. Sci. 44, No. 9, 1639--1650 (2013; Zbl 1278.93290) Full Text: DOI
Jha, P. C.; Kumar, Deepak; Kapur, P. K.; Saraj, M. Allocation policy for testing effort of modular software system under budgetary constraint. (English) Zbl 1219.90208 J. Inf. Optim. Sci. 32, No. 2, 315-337 (2011). MSC: 90C90 90C29 90C39 PDFBibTeX XMLCite \textit{P. C. Jha} et al., J. Inf. Optim. Sci. 32, No. 2, 315--337 (2011; Zbl 1219.90208) Full Text: DOI Link
Kapur, P. K.; Anand, Sameer; Yamada, Shigeru; Yadavalli, Venkata S. S. Stochastic differential equation-based flexible software reliability growth model. (English) Zbl 1191.68181 Math. Probl. Eng. 2009, Article ID 581383, 15 p. (2009). MSC: 68N30 60H10 PDFBibTeX XMLCite \textit{P. K. Kapur} et al., Math. Probl. Eng. 2009, Article ID 581383, 15 p. (2009; Zbl 1191.68181) Full Text: DOI EuDML
Damodaranc, D.; Gopal, G.; Kapur, P. K. Empirical Bayesian software reliability model using Rayleigh distribution. (English) Zbl 1453.62682 Opsearch 45, No. 4, 381-390 (2008). MSC: 62N05 90B25 PDFBibTeX XMLCite \textit{D. Damodaranc} et al., Opsearch 45, No. 4, 381--390 (2008; Zbl 1453.62682) Full Text: DOI
Kapur, P. K.; Kumar, Jyotish; Kumar, Ravi A unified modeling framework incorporating change-point for measuring reliability growth daring software testing. (English) Zbl 1453.90056 Opsearch 45, No. 4, 317-334 (2008). MSC: 90B25 68N01 PDFBibTeX XMLCite \textit{P. K. Kapur} et al., Opsearch 45, No. 4, 317--334 (2008; Zbl 1453.90056) Full Text: DOI
Kapur, P. K.; Goswami, D. N.; Bardhan, Amit; Singh, Ompal Flexible software reliability growth model with testing effort dependent learning process. (English) Zbl 1183.68194 Appl. Math. Modelling 32, No. 7, 1298-1307 (2008). MSC: 68N99 62N05 PDFBibTeX XMLCite \textit{P. K. Kapur} et al., Appl. Math. Modelling 32, No. 7, 1298--1307 (2008; Zbl 1183.68194) Full Text: DOI
Jha, P. C.; Gupta, Anshu; Kapur, P. K.; Gupta, Deepali Release time decision policy of software employed for the safety of critical system under uncertainty. (English) Zbl 1176.90293 Opsearch 45, No. 3, 209-224 (2008). MSC: 90B50 PDFBibTeX XMLCite \textit{P. C. Jha} et al., Opsearch 45, No. 3, 209--224 (2008; Zbl 1176.90293) Full Text: DOI
Kapur, P. K.; Singh, V. B.; Anand, Sameer; Yadavalli, V. S. S. Software reliability growth model with change-point and effort control using a power function of the testing time. (English) Zbl 1128.90394 Int. J. Prod. Res. 46, No. 3, 771-787 (2008). MSC: 90B30 PDFBibTeX XMLCite \textit{P. K. Kapur} et al., Int. J. Prod. Res. 46, No. 3, 771--787 (2008; Zbl 1128.90394) Full Text: DOI
Kapur, P. K.; Bardhan, A. K.; Yadavalli, V. S. S. On allocation of resources during testing phase of a modular software. (English) Zbl 1124.68017 Int. J. Syst. Sci. 38, No. 6, 493-499 (2007). MSC: 68N30 90C90 PDFBibTeX XMLCite \textit{P. K. Kapur} et al., Int. J. Syst. Sci. 38, No. 6, 493--499 (2007; Zbl 1124.68017) Full Text: DOI
Kapur, P. K.; Gupta, Amit; Kumar, Archana; Yamada, Shigeru Flexible software reliability growth models for distributed systems. (English) Zbl 1161.68354 Opsearch 42, No. 4, 378-398 (2005). MSC: 68M15 PDFBibTeX XMLCite \textit{P. K. Kapur} et al., Opsearch 42, No. 4, 378--398 (2005; Zbl 1161.68354) Full Text: DOI
Kapur, P. K.; Gupta, Anu; Singh, Ompal On discrete software reliability growth model and categorization of faults. (English) Zbl 1161.68355 Opsearch 42, No. 4, 340-354 (2005). MSC: 68M15 PDFBibTeX XMLCite \textit{P. K. Kapur} et al., Opsearch 42, No. 4, 340--354 (2005; Zbl 1161.68355) Full Text: DOI
Kapur, P. K.; Jha, P. C.; Bardhan, A. K. Optimal allocation of testing resource for a modular software. (English) Zbl 1056.90043 Asia-Pac. J. Oper. Res. 21, No. 3, 333-354 (2004). MSC: 90B25 90C39 91B32 PDFBibTeX XMLCite \textit{P. K. Kapur} et al., Asia-Pac. J. Oper. Res. 21, No. 3, 333--354 (2004; Zbl 1056.90043) Full Text: DOI
Kapur, P. K.; Bardhan, A. K.; Jha, P. C. Optimal reliability allocation problem for a modular software system. (English) Zbl 1210.90061 Opsearch 40, No. 2, 138-148 (2003). MSC: 90B25 90C90 PDFBibTeX XMLCite \textit{P. K. Kapur} et al., Opsearch 40, No. 2, 138--148 (2003; Zbl 1210.90061) Full Text: DOI