Cuminato, José A.; Oishi, Cassio M.; Figueiredo, Rafael A. Implicit methods for simulating low Reynolds number free surface flows: improvements on MAC-type methods. (English) Zbl 1326.76011 Wakayama, Masato (ed.) et al., The impact of applications on mathematics. Proceedings of the Forum of Mathematics for Industry, “Math-for-Industry 2013”, Fukuoka, Japan, November 4–8, 2013. Tokyo: Springer (ISBN 978-4-431-54906-2/hbk; 978-4-431-54907-9/ebook). Mathematics for Industry 1, 123-139 (2014). MSC: 76B07 76M25 76D05 76A05 PDFBibTeX XMLCite \textit{J. A. Cuminato} et al., Math. Ind. (Tokyo) 1, 123--139 (2014; Zbl 1326.76011) Full Text: DOI
Cuminato, J. A.; McKee, S. A note on the eigenvalues of a special class of matrices. (English) Zbl 1195.15020 J. Comput. Appl. Math. 234, No. 9, 2724-2731 (2010). Reviewer: Jorma K. Merikoski (Tampere) MSC: 15A42 65F15 65M06 35K05 PDFBibTeX XMLCite \textit{J. A. Cuminato} and \textit{S. McKee}, J. Comput. Appl. Math. 234, No. 9, 2724--2731 (2010; Zbl 1195.15020) Full Text: DOI
Oishi, C. M.; Cuminato, J. A.; Yuan, J. Y.; McKee, S. Stability of numerical schemes on staggered grids. (English) Zbl 1212.35184 Numer. Linear Algebra Appl. 15, No. 10, 945-967 (2008). MSC: 35K05 35Q30 65M12 PDFBibTeX XMLCite \textit{C. M. Oishi} et al., Numer. Linear Algebra Appl. 15, No. 10, 945--967 (2008; Zbl 1212.35184) Full Text: DOI
Oishi, Cassio M.; Tomé, Murilo F.; Cuminato, José A.; McKee, Sean An implicit technique for solving 3D low Reynolds number moving free surface flows. (English) Zbl 1141.76045 J. Comput. Phys. 227, No. 16, 7446-7468 (2008). MSC: 76M20 76D27 76A10 PDFBibTeX XMLCite \textit{C. M. Oishi} et al., J. Comput. Phys. 227, No. 16, 7446--7468 (2008; Zbl 1141.76045) Full Text: DOI
de Sampaio, Raimundo J. B.; Yuan, S.; Yuan, J. Y. Generalization: One technique of computational and applied mathematical methodology. (English) Zbl 1140.68550 Appl. Math. Comput. 200, No. 2, 574-582 (2008). MSC: 68W30 PDFBibTeX XMLCite \textit{R. J. B. de Sampaio} et al., Appl. Math. Comput. 200, No. 2, 574--582 (2008; Zbl 1140.68550) Full Text: DOI