Apley, Daniel W.; Shi, Jianjun A factor-analysis method for diagnosing variability in multivariate manufacturing processes. (English) Zbl 1072.62684 Technometrics 43, No. 1, 84-95 (2001). MSC: 62P30 62H25 PDFBibTeX XMLCite \textit{D. W. Apley} and \textit{J. Shi}, Technometrics 43, No. 1, 84--95 (2001; Zbl 1072.62684) Full Text: DOI
Priebe, Carey E.; Chen, Dalei Spatial scan density estimates. (English) Zbl 1072.62559 Technometrics 43, No. 1, 73-83 (2001). MSC: 62G07 PDFBibTeX XMLCite \textit{C. E. Priebe} and \textit{D. Chen}, Technometrics 43, No. 1, 73--83 (2001; Zbl 1072.62559) Full Text: DOI
Fokianos, Konstantinos; Kedem, Benjamin; Qin, Jing; Short, David A. A semiparametric approach to the one-way layout. (English) Zbl 1072.62583 Technometrics 43, No. 1, 56-65 (2001). MSC: 62G99 62G08 62J10 PDFBibTeX XMLCite \textit{K. Fokianos} et al., Technometrics 43, No. 1, 56--65 (2001; Zbl 1072.62583) Full Text: DOI
Miller, A.; Sitter, R. R. Using the folded-over 12-run Plackett-Burman design to consider interactions. (English) Zbl 1072.62622 Technometrics 43, No. 1, 44-55 (2001). MSC: 62K15 PDFBibTeX XMLCite \textit{A. Miller} and \textit{R. R. Sitter}, Technometrics 43, No. 1, 44--55 (2001; Zbl 1072.62622) Full Text: DOI
Mee, Robert Noncentral composite designs. (English) Zbl 1072.62624 Technometrics 43, No. 1, 34-43 (2001). MSC: 62K99 PDFBibTeX XMLCite \textit{R. Mee}, Technometrics 43, No. 1, 34--43 (2001; Zbl 1072.62624) Full Text: DOI
Trinca, Luzia A.; Gilmour, Steven G. Multistratum response surface designs. (English) Zbl 1072.62623 Technometrics 43, No. 1, 25-33 (2001). MSC: 62K20 PDFBibTeX XMLCite \textit{L. A. Trinca} and \textit{S. G. Gilmour}, Technometrics 43, No. 1, 25--33 (2001; Zbl 1072.62623) Full Text: DOI
Castillo, Enrique; Gutiérrez, José Manuel; Hadi, Ali S.; Lacruz, Beatriz Some applications of functional networks in statistics and engineering. (English) Zbl 1072.62503 Technometrics 43, No. 1, 10-24 (2001). MSC: 62P99 62P30 PDFBibTeX XMLCite \textit{E. Castillo} et al., Technometrics 43, No. 1, 10--24 (2001; Zbl 1072.62503) Full Text: DOI
Hall, Peter; Poskitt, D. S.; Presnell, Brett A functional data-analytic approach to signal discrimination. (English) Zbl 1072.62686 Technometrics 43, No. 1, 1-9 (2001). MSC: 62P30 62B10 94A12 PDFBibTeX XMLCite \textit{P. Hall} et al., Technometrics 43, No. 1, 1--9 (2001; Zbl 1072.62686) Full Text: DOI
Puig, Pedro; Stephens, Michael A. Tests of fit for the Laplace distribution, with applications. (English) Zbl 0996.62050 Technometrics 42, No. 4, 417-424 (2000). MSC: 62G10 62G20 62G30 PDFBibTeX XMLCite \textit{P. Puig} and \textit{M. A. Stephens}, Technometrics 42, No. 4, 417--424 (2000; Zbl 0996.62050) Full Text: DOI
Riani, Marco; Atkinson, Anthony C. Robust diagnostic data analysis: Transformations in regression. (English) Zbl 1014.62086 Technometrics 42, No. 4, 384-398 (2000). MSC: 62J20 62F35 PDFBibTeX XMLCite \textit{M. Riani} and \textit{A. C. Atkinson}, Technometrics 42, No. 4, 384--398 (2000; Zbl 1014.62086) Full Text: DOI
Kuhn, Andrew M.; Carter, Walter H.; Myers, Raymond H. Incorporating noise factors into experiments with censored data. (English) Zbl 0999.62096 Technometrics 42, No. 4, 376-383 (2000). MSC: 62P30 62N05 62K20 62N01 PDFBibTeX XMLCite \textit{A. M. Kuhn} et al., Technometrics 42, No. 4, 376--383 (2000; Zbl 0999.62096) Full Text: DOI
Yang, Jiangbin; Makis, Viliam Dynamic response of residuals to external deviations in a controlled production process. (English) Zbl 0999.62097 Technometrics 42, No. 3, 290-299 (2000). MSC: 62P30 62M10 93D15 PDFBibTeX XMLCite \textit{J. Yang} and \textit{V. Makis}, Technometrics 42, No. 3, 290--299 (2000; Zbl 0999.62097) Full Text: DOI
Huang, H.-C.; Cressie, N. Deterministic/stochastic wavelet decomposition for recovery of signal from noisy data. (English) Zbl 1013.62045 Technometrics 42, No. 3, 262-276 (2000). MSC: 62G08 62C12 62M40 65T60 PDFBibTeX XMLCite \textit{H. C. Huang} and \textit{N. Cressie}, Technometrics 42, No. 3, 262--276 (2000; Zbl 1013.62045) Full Text: DOI
McKean, Joseph W.; Sheather, Simon J. Partial residual plots based on robust fits. (English) Zbl 1013.62057 Technometrics 42, No. 3, 249-261 (2000). MSC: 62G35 62J20 62J05 PDFBibTeX XMLCite \textit{J. W. McKean} and \textit{S. J. Sheather}, Technometrics 42, No. 3, 249--261 (2000; Zbl 1013.62057) Full Text: DOI
Fang, Kai-Tai; Lin, Dennis K. J.; Winker, Peter; Zhang, Yong Uniform design: theory and application. (English) Zbl 0996.62073 Technometrics 42, No. 3, 237-248 (2000). MSC: 62K05 65K10 PDFBibTeX XMLCite \textit{K.-T. Fang} et al., Technometrics 42, No. 3, 237--248 (2000; Zbl 0996.62073) Full Text: DOI
Bedrick, Edward J. Checking for lack of fit in linear models with parametric variance functions. (English) Zbl 0999.62055 Technometrics 42, No. 3, 227-236 (2000). MSC: 62J20 62F03 62J05 62H15 PDFBibTeX XMLCite \textit{E. J. Bedrick}, Technometrics 42, No. 3, 227--236 (2000; Zbl 0999.62055) Full Text: DOI
Mee, Robert W.; Peralta, Marta Semifolding \(2^{k-p}\) designs. (English) Zbl 0999.62058 Technometrics 42, No. 2, 122-134 (2000). MSC: 62K15 62L05 PDFBibTeX XMLCite \textit{R. W. Mee} and \textit{M. Peralta}, Technometrics 42, No. 2, 122--134 (2000; Zbl 0999.62058) Full Text: DOI
Pan, Guohua The impact of unidentified location effects on dispersion-effects identification from unreplicated factorial designs. (English) Zbl 0998.62064 Technometrics 41, No. 4, 313-326 (1999). MSC: 62K15 62K25 62P30 PDFBibTeX XMLCite \textit{G. Pan}, Technometrics 41, No. 4, 313--326 (1999; Zbl 0998.62064) Full Text: DOI
Chen, Shun-Yi; Chen, Hubert J. A range test for the equivalency of means under unequal variances. (English) Zbl 1069.62506 Technometrics 41, No. 3, 250-260 (1999). MSC: 62F03 PDFBibTeX XMLCite \textit{S.-Y. Chen} and \textit{H. J. Chen}, Technometrics 41, No. 3, 250--260 (1999; Zbl 1069.62506) Full Text: DOI
Krishnamoorthy, K.; Mathew, Thomas Comparison of approximation methods for computing tolerance factors for a multivariate normal population. (English) Zbl 1069.62531 Technometrics 41, No. 3, 234-249 (1999). MSC: 62H10 65C05 65C60 PDFBibTeX XMLCite \textit{K. Krishnamoorthy} and \textit{T. Mathew}, Technometrics 41, No. 3, 234--249 (1999; Zbl 1069.62531) Full Text: DOI
Tan, Charles Y.; Iglewicz, Boris Measurement-methods comparisons and linear statistical relationship. (English) Zbl 0994.62068 Technometrics 41, No. 3, 192-201 (1999). MSC: 62J99 62F25 62J05 PDFBibTeX XMLCite \textit{C. Y. Tan} and \textit{B. Iglewicz}, Technometrics 41, No. 3, 192--201 (1999; Zbl 0994.62068) Full Text: DOI
Rosenbaum, Paul R. Blocking in compound dispersion experiments. (English) Zbl 1069.62559 Technometrics 41, No. 2, 125-134 (1999). MSC: 62P30 62K15 62K10 PDFBibTeX XMLCite \textit{P. R. Rosenbaum}, Technometrics 41, No. 2, 125--134 (1999; Zbl 1069.62559) Full Text: DOI
Escobar, Luis A.; Meeker, William Q. Statistical prediction based on censored life data. (English) Zbl 1069.62552 Technometrics 41, No. 2, 113-124 (1999). MSC: 62N01 62N05 62N99 65C60 PDFBibTeX XMLCite \textit{L. A. Escobar} and \textit{W. Q. Meeker}, Technometrics 41, No. 2, 113--124 (1999; Zbl 1069.62552) Full Text: DOI Link
Hedayat, A. S.; Stufken, John Compound orthogonal arrays. (English) Zbl 0998.62063 Technometrics 41, No. 1, 57-61 (1999). MSC: 62K15 62K99 PDFBibTeX XMLCite \textit{A. S. Hedayat} and \textit{J. Stufken}, Technometrics 41, No. 1, 57--61 (1999; Zbl 0998.62063) Full Text: DOI
Sen, Ananda Estimation of current reliability in a Duane-based reliability growth model. (English) Zbl 1069.62553 Technometrics 40, No. 4, 334-344 (1998); Correction ibid. 41, No. 4, 385 (1999). MSC: 62N05 62N02 PDFBibTeX XMLCite \textit{A. Sen}, Technometrics 40, No. 4, 334--344 (1999; Zbl 1069.62553) Full Text: DOI
Raghavachari, M. A note on optimal component test plans for series system reliability with exponential failure times. (English) Zbl 1072.62649 Technometrics 40, No. 4, 345-347 (1998). MSC: 62N05 PDFBibTeX XMLCite \textit{M. Raghavachari}, Technometrics 40, No. 4, 345--347 (1998; Zbl 1072.62649) Full Text: DOI
Morgan, J. P. Orthogonal collections of Latin squares. (English) Zbl 1064.62549 Technometrics 40, No. 4, 327-333 (1998). MSC: 62K05 62K10 PDFBibTeX XMLCite \textit{J. P. Morgan}, Technometrics 40, No. 4, 327--333 (1998; Zbl 1064.62549) Full Text: DOI
Huang, Peng; Chen, Dechang; Voelkel, Joseph O. Minimum-aberration two-level split-plot designs. (English) Zbl 1064.62552 Technometrics 40, No. 4, 314-326 (1998). MSC: 62K15 PDFBibTeX XMLCite \textit{P. Huang} et al., Technometrics 40, No. 4, 314--326 (1998; Zbl 1064.62552) Full Text: DOI Link
Venter, J. H.; Steel, S. J. Identifying active contrasts by stepwise testing. (English) Zbl 1063.62565 Technometrics 40, No. 4, 304-313 (1998). MSC: 62K15 PDFBibTeX XMLCite \textit{J. H. Venter} and \textit{S. J. Steel}, Technometrics 40, No. 4, 304--313 (1998; Zbl 1063.62565) Full Text: DOI
De Veaux, Richard D.; Schumi, Jennifer; Schweinsberg, Jason; Ungar, Lyle H. Prediction intervals for neural networks via nonlinear regression. (English) Zbl 1063.62582 Technometrics 40, No. 4, 273-282 (1998). MSC: 62M45 62G08 62M20 PDFBibTeX XMLCite \textit{R. D. De Veaux} et al., Technometrics 40, No. 4, 273--282 (1998; Zbl 1063.62582) Full Text: DOI
Wolfinger, Russell D.; Tobias, Randall D. Joint estimation of location, dispersion, and random effects in robust design. (English) Zbl 0896.62082 Technometrics 40, No. 1, 62-71 (1998). MSC: 62K99 62P30 PDFBibTeX XMLCite \textit{R. D. Wolfinger} and \textit{R. D. Tobias}, Technometrics 40, No. 1, 62--71 (1998; Zbl 0896.62082) Full Text: DOI
Cornell, John A.; Ramsey, Phillip J. A generalized mixture model for categorized-components problems with an application to a photoresist-coating experiment. (English) Zbl 0896.62083 Technometrics 40, No. 1, 48-61 (1998). MSC: 62K99 62P99 PDFBibTeX XMLCite \textit{J. A. Cornell} and \textit{P. J. Ramsey}, Technometrics 40, No. 1, 48--61 (1998; Zbl 0896.62083) Full Text: DOI
Berk, Kenneth N. Regression diagnostic plots in 3-D. (English) Zbl 0896.62074 Technometrics 40, No. 1, 39-47 (1998). MSC: 62J20 PDFBibTeX XMLCite \textit{K. N. Berk}, Technometrics 40, No. 1, 39--47 (1998; Zbl 0896.62074) Full Text: DOI
Zhang, Nien Fan A statistical control chart for stationary process data. (English) Zbl 0896.62110 Technometrics 40, No. 1, 24-38 (1998). MSC: 62P30 PDFBibTeX XMLCite \textit{N. F. Zhang}, Technometrics 40, No. 1, 24--38 (1998; Zbl 0896.62110) Full Text: DOI
Erkanli, Alaattin; Mazzuchi, Thomas A.; Soyer, Refik Bayesian computations for a class of reliability growth models. (English) Zbl 0896.62030 Technometrics 40, No. 1, 14-23 (1998). MSC: 62F15 62N05 65C99 PDFBibTeX XMLCite \textit{A. Erkanli} et al., Technometrics 40, No. 1, 14--23 (1998; Zbl 0896.62030) Full Text: DOI
Hu, X. Joan; Lawless, Jerald F.; Suzuki, Kazuyuki Nonparametric estimation of a lifetime distribution when censoring times are missing. (English) Zbl 0896.62031 Technometrics 40, No. 1, 3-13 (1998). MSC: 62G05 62N05 62G07 PDFBibTeX XMLCite \textit{X. J. Hu} et al., Technometrics 40, No. 1, 3--13 (1998; Zbl 0896.62031) Full Text: DOI Link
Holmström, Lasse; Sain, Stephan R. Multivariate discrimination methods for top quark analysis. (English) Zbl 0869.62043 Technometrics 39, No. 1, 91-99 (1997). MSC: 62H30 62P99 00A79 PDFBibTeX XMLCite \textit{L. Holmström} and \textit{S. R. Sain}, Technometrics 39, No. 1, 91--99 (1997; Zbl 0869.62043) Full Text: DOI
Kunert, Joachim On the use of the factor-sparsity assumption to get an estimate of the variance in saturated designs. (English) Zbl 0869.62053 Technometrics 39, No. 1, 81-90 (1997). MSC: 62K99 62P30 PDFBibTeX XMLCite \textit{J. Kunert}, Technometrics 39, No. 1, 81--90 (1997; Zbl 0869.62053) Full Text: DOI
Song, Ruiguang; Shulman, Stanley A. Variance components in the two-way nested model with incomplete nesting information. (English) Zbl 0869.62047 Technometrics 39, No. 1, 71-80 (1997). MSC: 62J10 PDFBibTeX XMLCite \textit{R. Song} and \textit{S. A. Shulman}, Technometrics 39, No. 1, 71--80 (1997; Zbl 0869.62047) Full Text: DOI
Borkowski, John J.; Lucas, James M. Designs of mixed resolution for process robustness studies. (English) Zbl 0869.62070 Technometrics 39, No. 1, 63-70 (1997). MSC: 62P30 62K05 PDFBibTeX XMLCite \textit{J. J. Borkowski} and \textit{J. M. Lucas}, Technometrics 39, No. 1, 63--70 (1997; Zbl 0869.62070) Full Text: DOI
Bisgaard, Søren; Steinberg, David M. The design and analysis of \(2^{k-p} \times s\) prototype experiments. (English) Zbl 0869.62069 Technometrics 39, No. 1, 52-62 (1997). MSC: 62P30 62K15 PDFBibTeX XMLCite \textit{S. Bisgaard} and \textit{D. M. Steinberg}, Technometrics 39, No. 1, 52--62 (1997; Zbl 0869.62069) Full Text: DOI
Cressie, Noel Jackknifing in the presence of inhomogeneity. (English) Zbl 0869.62020 Technometrics 39, No. 1, 45-51 (1997). MSC: 62F10 00A79 62F12 62P99 PDFBibTeX XMLCite \textit{N. Cressie}, Technometrics 39, No. 1, 45--51 (1997; Zbl 0869.62020) Full Text: DOI
Durham, S. D.; Padgett, W. J. Cumulative damage models for system failure with application to Carbon fibers, and composites. (English) Zbl 0869.62067 Technometrics 39, No. 1, 34-44 (1997). MSC: 62N05 PDFBibTeX XMLCite \textit{S. D. Durham} and \textit{W. J. Padgett}, Technometrics 39, No. 1, 34--44 (1997; Zbl 0869.62067) Full Text: DOI
Wang, C. Ming; Vecchia, Dominic F.; Young, Matt; Brilliant, Nathan A. Robust regression applied to optical-fiber dimensional quality control. (English) Zbl 0875.62473 Technometrics 39, No. 1, 25-33 (1997). MSC: 62P30 62F35 PDFBibTeX XMLCite \textit{C. M. Wang} et al., Technometrics 39, No. 1, 25--33 (1997; Zbl 0875.62473) Full Text: DOI
Dowling, M. M.; Griffin, P. M.; Tsui, K.-L.; Zhou, C. Statistical issues in geometric feature inspection using coordinate measuring machines. (With discussion). (English) Zbl 0900.62573 Technometrics 39, No. 1, 3-24 (1997). MSC: 62N99 PDFBibTeX XMLCite \textit{M. M. Dowling} et al., Technometrics 39, No. 1, 3--24 (1997; Zbl 0900.62573) Full Text: DOI
Hall, Peter; Padmanabhan, A. R. Adaptive inference for the two-sample scale problem. (English) Zbl 0913.62046 Technometrics 39, No. 4, 412-422 (1997). MSC: 62G10 62F35 62G35 62G09 PDFBibTeX XMLCite \textit{P. Hall} and \textit{A. R. Padmanabhan}, Technometrics 39, No. 4, 412--422 (1997; Zbl 0913.62046) Full Text: DOI
Cheng, Chi-Lun; Van Ness, John W. Robust calibration. (English) Zbl 0935.62032 Technometrics 39, No. 4, 401-411 (1997). MSC: 62F35 62J99 PDFBibTeX XMLCite \textit{C.-L. Cheng} and \textit{J. W. Van Ness}, Technometrics 39, No. 4, 401--411 (1997; Zbl 0935.62032) Full Text: DOI
Lu, Jye-Chyi; Park, Jinho; Yang, Qing Statistical inference of a time-to-failure distribution derived from linear degradation data. (English) Zbl 0935.62114 Technometrics 39, No. 4, 391-400 (1997). MSC: 62N05 62P30 PDFBibTeX XMLCite \textit{J.-C. Lu} et al., Technometrics 39, No. 4, 391--400 (1997; Zbl 0935.62114) Full Text: DOI
Sitter, Randy R.; Chen, Jiahua; Feder, Moshe Fractional resolution and minimum aberration in blocked \(2^{n-k}\) designs. (English) Zbl 0913.62073 Technometrics 39, No. 4, 382-390 (1997). MSC: 62K15 PDFBibTeX XMLCite \textit{R. R. Sitter} et al., Technometrics 39, No. 4, 382--390 (1997; Zbl 0913.62073) Full Text: DOI
Chipman, H.; Hamada, M.; Wu, C. F. J. A Bayesian variable-selection approach for analyzing designed experiments with complex aliasing. (English) Zbl 1063.62528 Technometrics 39, No. 4, 372-381 (1997). MSC: 62F15 62K15 PDFBibTeX XMLCite \textit{H. Chipman} et al., Technometrics 39, No. 4, 372--381 (1997; Zbl 1063.62528) Full Text: DOI Link
Li, Ta-Hsin Time series characterization, Poisson integral, and robust divergence measures. (English) Zbl 0935.62104 Technometrics 39, No. 4, 357-371 (1997). MSC: 62M15 62M10 PDFBibTeX XMLCite \textit{T.-H. Li}, Technometrics 39, No. 4, 357--371 (1997; Zbl 0935.62104) Full Text: DOI
Atkinson, Anthony C.; Bogacka, Barbara Compound \(D\)- and \(D_s\)-optimum designs for determining the order of a chemical reaction. (English) Zbl 0913.62066 Technometrics 39, No. 4, 347-356 (1997). MSC: 62K05 92E20 PDFBibTeX XMLCite \textit{A. C. Atkinson} and \textit{B. Bogacka}, Technometrics 39, No. 4, 347--356 (1997; Zbl 0913.62066) Full Text: DOI
Grillenzoni, Carlo Recursive generalized M-estimators of system parameters. (English) Zbl 0902.62114 Technometrics 39, No. 2, 211-224 (1997). MSC: 62M10 62F35 62J02 PDFBibTeX XMLCite \textit{C. Grillenzoni}, Technometrics 39, No. 2, 211--224 (1997; Zbl 0902.62114) Full Text: DOI
Hirose, Hideo; Lai, Tze Leung Inference from grouped data in three-parameter Weibull models with applications to breakdown-voltage experiments. (English) Zbl 0889.62088 Technometrics 39, No. 2, 199-210 (1997). MSC: 62N99 62F25 PDFBibTeX XMLCite \textit{H. Hirose} and \textit{T. L. Lai}, Technometrics 39, No. 2, 199--210 (1997; Zbl 0889.62088) Full Text: DOI
Bergman, Bo; Hynén, Anders Dispersion effects from unreplicated designs in the \(2^{k-p}\) series. (English) Zbl 0889.62068 Technometrics 39, No. 2, 191-198 (1997). MSC: 62K15 62P30 PDFBibTeX XMLCite \textit{B. Bergman} and \textit{A. Hynén}, Technometrics 39, No. 2, 191--198 (1997; Zbl 0889.62068) Full Text: DOI
Loughin, Thomas M.; Noble, William A permutation test for effects in an unreplicated factorial design. (English) Zbl 0882.62074 Technometrics 39, No. 2, 180-190 (1997). MSC: 62K15 62G10 PDFBibTeX XMLCite \textit{T. M. Loughin} and \textit{W. Noble}, Technometrics 39, No. 2, 180--190 (1997; Zbl 0882.62074) Full Text: DOI
Li, William W.; Wu, C. F. Jeff Columnwise-pairwise algorithms with applications to the construction of supersaturated designs. (English) Zbl 0889.62066 Technometrics 39, No. 2, 171-179 (1997). MSC: 62K05 PDFBibTeX XMLCite \textit{W. W. Li} and \textit{C. F. J. Wu}, Technometrics 39, No. 2, 171--179 (1997; Zbl 0889.62066) Full Text: DOI
Rocke, David M.; Jones, Geoffrey Optimal design for ELISA and other forms of immunoassay. (English) Zbl 0882.62106 Technometrics 39, No. 2, 162-170 (1997). MSC: 62P10 62K05 PDFBibTeX XMLCite \textit{D. M. Rocke} and \textit{G. Jones}, Technometrics 39, No. 2, 162--170 (1997; Zbl 0882.62106) Full Text: DOI Link
Miller, Arden Strip-plot configurations of fractional factorials. (English) Zbl 0889.62069 Technometrics 39, No. 2, 153-161 (1997). MSC: 62K15 62N99 PDFBibTeX XMLCite \textit{A. Miller}, Technometrics 39, No. 2, 153--161 (1997; Zbl 0889.62069) Full Text: DOI
Bisgaard, Søren Designing experiments for tolerancing assembled products. (English) Zbl 0889.62086 Technometrics 39, No. 2, 142-152 (1997). MSC: 62P30 62K15 PDFBibTeX XMLCite \textit{S. Bisgaard}, Technometrics 39, No. 2, 142--152 (1997; Zbl 0889.62086) Full Text: DOI
Tatum, Lawrence G. Robust estimation of the process standard deviation for control charts. (English) Zbl 0889.62087 Technometrics 39, No. 2, 127-141 (1997). MSC: 62P30 62F35 PDFBibTeX XMLCite \textit{L. G. Tatum}, Technometrics 39, No. 2, 127--141 (1997; Zbl 0889.62087) Full Text: DOI
Wang, C. Ming; Lam, C. Teresa A mixed-effects model for the analysis of circular measurements. (English) Zbl 0889.62089 Technometrics 39, No. 2, 119-126 (1997). MSC: 62N99 62J10 PDFBibTeX XMLCite \textit{C. M. Wang} and \textit{C. T. Lam}, Technometrics 39, No. 2, 119--126 (1997; Zbl 0889.62089) Full Text: DOI
Carey, V. J.; Walters, E. E.; Wager, C. G.; Rosner, B. A. Resistant and test based outlier rejection: Effects on Gaussian one- and two-sample inference. (English) Zbl 0892.62060 Technometrics 39, No. 3, 320-330 (1997). MSC: 62L10 62F35 62F03 62P99 PDFBibTeX XMLCite \textit{V. J. Carey} et al., Technometrics 39, No. 3, 320--330 (1997; Zbl 0892.62060) Full Text: DOI
Kalagnanam, Jayant R.; Diwekar, Urmila M. An efficient sampling technique for off-line quality control. (English) Zbl 0896.62106 Technometrics 39, No. 3, 308-319 (1997). MSC: 62P30 90C15 PDFBibTeX XMLCite \textit{J. R. Kalagnanam} and \textit{U. M. Diwekar}, Technometrics 39, No. 3, 308--319 (1997; Zbl 0896.62106) Full Text: DOI
Sun, Don X.; Wu, C. F. Jeff; Chen, Youyi Optimal blocking schemes for \(2^n\) and \(2^{n-p}\) designs. (English) Zbl 0891.62055 Technometrics 39, No. 3, 298-307 (1997). MSC: 62K15 62K05 62Q05 PDFBibTeX XMLCite \textit{D. X. Sun} et al., Technometrics 39, No. 3, 298--307 (1997; Zbl 0891.62055) Full Text: DOI
Filliben, James J.; Li, Ker-Chau A systematic approach to the analysis of complex interaction patterns in two-level factorial designs. (English) Zbl 0892.62058 Technometrics 39, No. 3, 286-297 (1997). MSC: 62K15 62N99 62A09 PDFBibTeX XMLCite \textit{J. J. Filliben} and \textit{K.-C. Li}, Technometrics 39, No. 3, 286--297 (1997; Zbl 0892.62058) Full Text: DOI
Wludyka, Peter S.; Nelson, Peter R. An analysis-of-means-type test for variances from normal populations. (English) Zbl 0891.62047 Technometrics 39, No. 3, 274-285 (1997). MSC: 62J10 62J15 62K99 62A09 PDFBibTeX XMLCite \textit{P. S. Wludyka} and \textit{P. R. Nelson}, Technometrics 39, No. 3, 274--285 (1997; Zbl 0891.62047) Full Text: DOI
Ruppert, David; Wand, M. P.; Holst, Ulla; Hössjer, Ola Local polynomial variance-function estimation. (English) Zbl 0891.62029 Technometrics 39, No. 3, 262-273 (1997). MSC: 62G07 62P99 62G20 PDFBibTeX XMLCite \textit{D. Ruppert} et al., Technometrics 39, No. 3, 262--273 (1997; Zbl 0891.62029) Full Text: DOI Link
Faraway, Julian J. Regression analysis for a functional response. (English) Zbl 0891.62027 Technometrics 39, No. 3, 254-261 (1997). MSC: 62G07 PDFBibTeX XMLCite \textit{J. J. Faraway}, Technometrics 39, No. 3, 254--261 (1997; Zbl 0891.62027) Full Text: DOI Link
Hansen, Mark H.; Nair, Vijayan N.; Friedman, David J. Monitoring wafer map data from integrated circuit fabrication processes for spatially clustered defects. (English) Zbl 0891.62074 Technometrics 39, No. 3, 241-253 (1997). MSC: 62P30 62M40 62M30 PDFBibTeX XMLCite \textit{M. H. Hansen} et al., Technometrics 39, No. 3, 241--253 (1997; Zbl 0891.62074) Full Text: DOI
Kim, Choongrak; Storer, Barry E.; Jeong, Meeseon A note on Box-Cox transformation diagnostics. (English) Zbl 0874.62076 Technometrics 38, No. 2, 178-180 (1996). MSC: 62J20 62J05 PDFBibTeX XMLCite \textit{C. Kim} et al., Technometrics 38, No. 2, 178--180 (1996; Zbl 0874.62076) Full Text: DOI
Lamb, R. H.; Boos, Dennis D.; Brownie, Cavell Testing for effects on variance in experiments with factorial treatment structure and nested errors. (English) Zbl 0871.62065 Technometrics 38, No. 2, 170-177 (1996). MSC: 62K15 62P30 62J10 PDFBibTeX XMLCite \textit{R. H. Lamb} et al., Technometrics 38, No. 2, 170--177 (1996; Zbl 0871.62065) Full Text: DOI
Venter, J. H.; Steel, S. J. A hypothesis-testing approach toward identifying active contrasts. (English) Zbl 0871.62066 Technometrics 38, No. 2, 161-169 (1996). MSC: 62K15 62F03 PDFBibTeX XMLCite \textit{J. H. Venter} and \textit{S. J. Steel}, Technometrics 38, No. 2, 161--169 (1996; Zbl 0871.62066) Full Text: DOI
Tatum, Lawrence G. Control charts for the detection of a periodic component. (English) Zbl 0871.62086 Technometrics 38, No. 2, 152-160 (1996). MSC: 62P30 62M15 PDFBibTeX XMLCite \textit{L. G. Tatum}, Technometrics 38, No. 2, 152--160 (1996; Zbl 0871.62086) Full Text: DOI
Vander Wiel, S. A. Monitoring processes that wander using integrated moving average models. (English) Zbl 0871.62087 Technometrics 38, No. 2, 139-151 (1996). MSC: 62P30 PDFBibTeX XMLCite \textit{S. A. Vander Wiel}, Technometrics 38, No. 2, 139--151 (1996; Zbl 0871.62087) Full Text: DOI Link
Lawless, J. F.; Thiagarajah, K. A point-process model incorporating renewals and time trends, with application to repairable systems. (English) Zbl 0870.62075 Technometrics 38, No. 2, 131-138 (1996). MSC: 62N05 60K10 PDFBibTeX XMLCite \textit{J. F. Lawless} and \textit{K. Thiagarajah}, Technometrics 38, No. 2, 131--138 (1996; Zbl 0870.62075) Full Text: DOI
Olin, Bryan D.; Meeker, William Q. Applications of statistical methods to nondestructive evaluation. (With discussion). (English) Zbl 0870.62080 Technometrics 38, No. 2, 95-130 (1996). MSC: 62P30 62N99 PDFBibTeX XMLCite \textit{B. D. Olin} and \textit{W. Q. Meeker}, Technometrics 38, No. 2, 95--130 (1996; Zbl 0870.62080) Full Text: DOI
Nguyen, Nam-Ky An algorithmic approach to constructing supersaturated designs. (English) Zbl 0900.62416 Technometrics 38, No. 1, 69-73 (1996). MSC: 62K10 65C99 PDFBibTeX XMLCite \textit{N.-K. Nguyen}, Technometrics 38, No. 1, 69--73 (1996; Zbl 0900.62416) Full Text: DOI Link
Thomas, James P.; Wei, Robert P. Standard-error estimates for rates of change from indirect measurements. (English) Zbl 0870.62060 Technometrics 38, No. 1, 59-68 (1996). MSC: 62J99 62N99 65C99 PDFBibTeX XMLCite \textit{J. P. Thomas} and \textit{R. P. Wei}, Technometrics 38, No. 1, 59--68 (1996; Zbl 0870.62060) Full Text: DOI
Efromovich, Sam; Thomas, Edward V. Application of nonparametric binary regression to evaluate the sensitivity of explosives. (English) Zbl 0900.62536 Technometrics 38, No. 1, 50-58 (1996). MSC: 62N05 62N99 62G07 PDFBibTeX XMLCite \textit{S. Efromovich} and \textit{E. V. Thomas}, Technometrics 38, No. 1, 50--58 (1996; Zbl 0900.62536) Full Text: DOI
Boyles, Russell A. Multivariate process analysis with lattice data. (English) Zbl 0873.62113 Technometrics 38, No. 1, 37-49 (1996). MSC: 62P30 PDFBibTeX XMLCite \textit{R. A. Boyles}, Technometrics 38, No. 1, 37--49 (1996; Zbl 0873.62113) Full Text: DOI
Liski, Erkki P.; Nummi, Tapio Prediction in repeated-measures models with engineering applications. (English) Zbl 0873.62072 Technometrics 38, No. 1, 25-36 (1996). MSC: 62J99 62N99 62N05 PDFBibTeX XMLCite \textit{E. P. Liski} and \textit{T. Nummi}, Technometrics 38, No. 1, 25--36 (1996; Zbl 0873.62072) Full Text: DOI
Martz, Harry F.; Kvam, Paul H.; Abramson, Lee R. Empirical Bayes estimation of the reliability of nuclear-power-plant emergency diesel generators. (English) Zbl 0873.62110 Technometrics 38, No. 1, 11-24 (1996). MSC: 62N05 62C12 PDFBibTeX XMLCite \textit{H. F. Martz} et al., Technometrics 38, No. 1, 11--24 (1996; Zbl 0873.62110) Full Text: DOI
Chipman, Hugh; Hamada, Michael Bayesian analysis of ordered categorical data from industrial experiments. (English) Zbl 0873.62115 Technometrics 38, No. 1, 1-10 (1996). MSC: 62N99 62F15 62J12 PDFBibTeX XMLCite \textit{H. Chipman} and \textit{M. Hamada}, Technometrics 38, No. 1, 1--10 (1996; Zbl 0873.62115) Full Text: DOI Link
Nguyen, Nam-Ky A note on the construction of near-orthogonal arrays with mixed levels and economic run size. (English) Zbl 0902.62089 Technometrics 38, No. 3, 279-283 (1996). MSC: 62K15 62K10 62K05 PDFBibTeX XMLCite \textit{N.-K. Nguyen}, Technometrics 38, No. 3, 279--283 (1996; Zbl 0902.62089) Full Text: DOI Link
Cook, R. Dennis Added-variable plots and curvature in linear regression. (English) Zbl 0896.62065 Technometrics 38, No. 3, 275-278 (1996). MSC: 62J05 62J20 PDFBibTeX XMLCite \textit{R. D. Cook}, Technometrics 38, No. 3, 275--278 (1996; Zbl 0896.62065) Full Text: DOI
Deutsch, Clayton V. Constrained smoothing of histograms and scatterplots with simulated annealing. (English) Zbl 0898.62126 Technometrics 38, No. 3, 266-274 (1996). MSC: 62N99 62G99 PDFBibTeX XMLCite \textit{C. V. Deutsch}, Technometrics 38, No. 3, 266--274 (1996; Zbl 0898.62126) Full Text: DOI
Baker, R. D. Some new tests of the power law process. (English) Zbl 0898.62121 Technometrics 38, No. 3, 256-265 (1996). MSC: 62N05 62G10 PDFBibTeX XMLCite \textit{R. D. Baker}, Technometrics 38, No. 3, 256--265 (1996; Zbl 0898.62121) Full Text: DOI
Flehinger, Betty J.; Reiser, Benjamin; Yashchin, Emmanuel Inference about defects in the presence of masking. (English) Zbl 0896.62100 Technometrics 38, No. 3, 247-255 (1996). MSC: 62N05 PDFBibTeX XMLCite \textit{B. J. Flehinger} et al., Technometrics 38, No. 3, 247--255 (1996; Zbl 0896.62100) Full Text: DOI
Bisgaard, Søren; Ankenman, Bruce Standard errors for the eigenvalues in second-order response surface models. (English) Zbl 0945.62079 Technometrics 38, No. 3, 238-246 (1996). MSC: 62K20 62J99 PDFBibTeX XMLCite \textit{S. Bisgaard} and \textit{B. Ankenman}, Technometrics 38, No. 3, 238--246 (1996; Zbl 0945.62079) Full Text: DOI Link
Steiner, Stefan H.; Geyer, P. Lee; Wesolowsky, George O. Grouped data-sequential probability ratio tests and cumulative sum control charts. (English) Zbl 0902.62094 Technometrics 38, No. 3, 230-237 (1996). MSC: 62L10 62P30 PDFBibTeX XMLCite \textit{S. H. Steiner} et al., Technometrics 38, No. 3, 230--237 (1996; Zbl 0902.62094) Full Text: DOI Link
Mee, Robert W.; Eberhardt, Keith R. A comparison of uncertainty criteria for calibration. (English) Zbl 0898.62092 Technometrics 38, No. 3, 221-229 (1996). MSC: 62J99 62J05 PDFBibTeX XMLCite \textit{R. W. Mee} and \textit{K. R. Eberhardt}, Technometrics 38, No. 3, 221--229 (1996; Zbl 0898.62092) Full Text: DOI
Stern, Hal S. Neural networks in applied statistics. (With discussion). (English) Zbl 0896.62098 Technometrics 38, No. 3, 205-220 (1996). MSC: 62M20 62P99 68T05 PDFBibTeX XMLCite \textit{H. S. Stern}, Technometrics 38, No. 3, 205--220 (1996; Zbl 0896.62098) Full Text: DOI
Hirst, David Error-rate estimation in multiple-group linear discriminant analysis. (English) Zbl 0898.62076 Technometrics 38, No. 4, 389-399 (1996). MSC: 62H30 PDFBibTeX XMLCite \textit{D. Hirst}, Technometrics 38, No. 4, 389--399 (1996; Zbl 0898.62076) Full Text: DOI
Kvam, Paul H. Estimation techniques for common cause failure data with different system sizes. (English) Zbl 0902.62123 Technometrics 38, No. 4, 382-388 (1996). MSC: 62N05 PDFBibTeX XMLCite \textit{P. H. Kvam}, Technometrics 38, No. 4, 382--388 (1996; Zbl 0902.62123) Full Text: DOI
Marx, Brian D. Iteratively reweighted partial least squares estimation for generalized linear regression. (English) Zbl 0902.62081 Technometrics 38, No. 4, 374-381 (1996). MSC: 62J12 62H25 PDFBibTeX XMLCite \textit{B. D. Marx}, Technometrics 38, No. 4, 374--381 (1996; Zbl 0902.62081) Full Text: DOI
Engel, Jan; Huele, A. Freek A generalized linear modeling approach to robust design. (English) Zbl 0896.62071 Technometrics 38, No. 4, 365-373 (1996). MSC: 62J12 62P30 62K99 62N99 PDFBibTeX XMLCite \textit{J. Engel} and \textit{A. F. Huele}, Technometrics 38, No. 4, 365--373 (1996; Zbl 0896.62071) Full Text: DOI
Rosenbaum, Paul R. Some useful compound dispersion experiments in quality design. (English) Zbl 0896.62107 Technometrics 38, No. 4, 354-364 (1996). MSC: 62P30 62K15 PDFBibTeX XMLCite \textit{P. R. Rosenbaum}, Technometrics 38, No. 4, 354--364 (1996; Zbl 0896.62107) Full Text: DOI
Liao, C. T.; Iyer, H. K.; Vecchia, D. F. Construction of orthogonal two-level designs of user-specified resolution where \(N\neq 2^k\). (English) Zbl 0896.62081 Technometrics 38, No. 4, 342-353 (1996). MSC: 62K15 PDFBibTeX XMLCite \textit{C. T. Liao} et al., Technometrics 38, No. 4, 342--353 (1996; Zbl 0896.62081) Full Text: DOI
Atkinson, A. C.; Donev, A. N. Experimental designs optimally balanced for trend. (English) Zbl 0896.62077 Technometrics 38, No. 4, 333-341 (1996). MSC: 62K05 PDFBibTeX XMLCite \textit{A. C. Atkinson} and \textit{A. N. Donev}, Technometrics 38, No. 4, 333--341 (1996; Zbl 0896.62077) Full Text: DOI