Hansen, Mark H.; Nair, Vijayan N.; Friedman, David J. Monitoring wafer map data from integrated circuit fabrication processes for spatially clustered defects. (English) Zbl 0891.62074 Technometrics 39, No. 3, 241-253 (1997). MSC: 62P30 62M40 62M30 PDFBibTeX XMLCite \textit{M. H. Hansen} et al., Technometrics 39, No. 3, 241--253 (1997; Zbl 0891.62074) Full Text: DOI
Nair, Vijayan N.; Wang, Paul C. C. Maximum likelihood estimation under a successive sampling discovery model. (English) Zbl 0695.62008 Technometrics 31, No. 4, 423-436 (1989). MSC: 62D05 62N99 62F10 62P99 PDFBibTeX XMLCite \textit{V. N. Nair} and \textit{P. C. C. Wang}, Technometrics 31, No. 4, 423--436 (1989; Zbl 0695.62008) Full Text: DOI
Nair, Vijayan N.; Pregibon, Daryl Analyzing dispersion effects from replicated factorial experiments. (English) Zbl 0655.62097 Technometrics 30, No. 3, 247-257 (1988). Reviewer: Vijayan N. Nair MSC: 62P30 62K15 PDFBibTeX XMLCite \textit{V. N. Nair} and \textit{D. Pregibon}, Technometrics 30, No. 3, 247--257 (1988; Zbl 0655.62097) Full Text: DOI
Nair, Vijayan N. Testing in industrial experiments with ordered categorical data (with discussion). (English) Zbl 0611.62129 Technometrics 28, 283-311 (1986). Reviewer: E.von Collani MSC: 62P30 PDFBibTeX XMLCite \textit{V. N. Nair}, Technometrics 28, 283--311 (1986; Zbl 0611.62129) Full Text: DOI