Phipps, Eric T.; Bartlett, Roscoe A.; Gay, David M.; Hoekstra, Robert J. Large-scale transient sensitivity analysis of a radiation-damaged bipolar junction transistor via automatic differentiation. (English) Zbl 1147.78003 Bischof, Christian H. (ed.) et al., Advances in automatic differentiation. Selected papers based on the presentations at the 5th international conference on automatic differentiation, Bonn, Germany, August 11–15, 2008. Berlin: Springer (ISBN 978-3-540-68935-5/pbk). Lecture Notes in Computational Science and Engineering 64, 351-362 (2008). Summary: Automatic differentiation (AD) is useful in transient sensitivity analysis of a computational simulation of a bipolar junction transistor subject to radiation damage. We used forward-mode AD, implemented in a new Trilinos package called Sacado, to compute analytic derivatives for implicit time integration and forward sensitivity analysis. Sacado addresses element-based simulation codes written in C++ and works well with forward sensitivity analysis as implemented in the Trilinos time-integration package Rythmos. The forward sensitivity calculation is significantly more efficient and robust than finite differencing.For the entire collection see [Zbl 1143.65003]. Cited in 3 Documents MSC: 78M10 Finite element, Galerkin and related methods applied to problems in optics and electromagnetic theory 78-04 Software, source code, etc. for problems pertaining to optics and electromagnetic theory 78M50 Optimization problems in optics and electromagnetic theory 90C31 Sensitivity, stability, parametric optimization 65F10 Iterative numerical methods for linear systems 65D25 Numerical differentiation Keywords:sensitivity analysis; radiation damage; bipolar junction transistor; forward mode; Trilinos; Sacado; Rythmos Software:Rythmos; SUNDIALS; TFad; ALBERTA; Trilinos; Sacado PDFBibTeX XMLCite \textit{E. T. Phipps} et al., Lect. Notes Comput. Sci. Eng. 64, 351--362 (2008; Zbl 1147.78003)