Chiou, Paul; Han, C. P. Shrinkage estimation of threshold parameter of the exponential distribution. (English) Zbl 0694.62013 IEEE Trans. Reliab. 38, No. 4, 449-453 (1989). Cited in 4 Documents MSC: 62F10 Point estimation 62N05 Reliability and life testing Keywords:mean square error; effective interval; preliminary test estimator; threshold parameter; exponential distribution; censored samples; optimal levels of significance; critical values; optimal values of shrinkage coefficients; preliminary test shrinkage estimator; minimax regret criterion PDFBibTeX XMLCite \textit{P. Chiou} and \textit{C. P. Han}, IEEE Trans. Reliab. 38, No. 4, 449--453 (1989; Zbl 0694.62013) Full Text: DOI