Nakamichi, Matsuroh; Itoh, Hideo A unified approach to composite MVL with monotonic subfunction. (English) Zbl 0563.94020 Multiple-valued logic, Proc. 13th Int. Symp., Kyoto/Jap. 1983, 300-305 (1983). MSC: 94C10 PDFBibTeX XML
Chen, Tinghuai; Yuan, Youguang; Liu, Zhimo; Zhang, Zhimin Four-valued logic, star algorithm and their applications. (English) Zbl 0561.94014 Multiple-valued logic, Proc. 13th Int. Symp., Kyoto/Jap. 1983, 314-325 (1983). MSC: 94C10 PDFBibTeX XML
Red’kin, N. P. On complete verifying tests for contact schemes. (Russian) Zbl 0549.94035 Metody Diskretn. Anal. 39, 80-87 (1983). Reviewer: Ioan Tomescu (Bucureşti) MSC: 94C10 94C12 PDFBibTeX XMLCite \textit{N. P. Red'kin}, Metody Diskretn. Anal. 39, 80--87 (1983; Zbl 0549.94035)
Lorents, A. A. Recognition of a fault of a finite automaton. (Russian) Zbl 0549.68055 Teor. Konechnykh Avtom. Prilozh. 15, 125-135 (1983). Reviewer: A.D.Koršunov MSC: 68Q45 PDFBibTeX XMLCite \textit{A. A. Lorents}, Teor. Konechnykh Avtom. Prilozh. 15, 125--135 (1983; Zbl 0549.68055)
Saluja, Kewal K.; Kinoshita, Kozo; Fujiwara, Hideo An easily testable design of programmable logic arrays for multiple faults. (English) Zbl 0525.94025 IEEE Trans. Comput. 32, 1038-1046 (1983). MSC: 94C10 PDFBibTeX XMLCite \textit{K. K. Saluja} et al., IEEE Trans. Comput. 32, 1038--1046 (1983; Zbl 0525.94025) Full Text: DOI
Karpovsky, M. Universal tests for detection of input/output stuck-at and bridging faults. (English) Zbl 0525.94024 IEEE Trans. Comput. 32, 1194-1198 (1983). MSC: 94C10 PDFBibTeX XMLCite \textit{M. Karpovsky}, IEEE Trans. Comput. 32, 1194--1198 (1983; Zbl 0525.94024) Full Text: DOI
Miller, D. M.; Muzio, J. C. Spectral fault signatures for internally unate combinational networks. (English) Zbl 0525.94023 IEEE Trans. Comput. 32, 1058-1062 (1983). MSC: 94C10 PDFBibTeX XMLCite \textit{D. M. Miller} and \textit{J. C. Muzio}, IEEE Trans. Comput. 32, 1058--1062 (1983; Zbl 0525.94023) Full Text: DOI
Boyarinov, I. M.; Davydov, A. A.; Mamedli, Eh. M.; Smerkis, Yu. B. Use of noise-tolerant encoding for protection of data from operator error. (English. Russian original) Zbl 0525.68070 Autom. Remote Control 44, 141-177 (1983); translation from Avtom. Telemekh. 1983, No. 2, 5-49 (1983). MSC: 68P20 94A15 68N25 94B99 68-02 94-02 68P05 PDFBibTeX XMLCite \textit{I. M. Boyarinov} et al., Autom. Remote Control 44, 141--177 (1983; Zbl 0525.68070); translation from Avtom. Telemekh. 1983, No. 2, 5--49 (1983)
Himmelblau, D. M. Fault detection and diagnosis in continuous nonlinear systems. (English) Zbl 0521.93057 Mathematical methods for the analysis of large-scale systems, Proc. 4th Formator Symp., Liblice/Czech. 1982, 271-286 (1983). MSC: 93E10 93C10 93E12 60G35 62N99 80A30 93E11 PDFBibTeX XML
Bhattacharyya, Asok On a novel approach of fault detection in an easily testable sequential machine with extra inputs and extra outputs. (English) Zbl 0518.68031 IEEE Trans. Comput. 32, 323-325 (1983). MSC: 68Q45 PDFBibTeX XMLCite \textit{A. Bhattacharyya}, IEEE Trans. Comput. 32, 323--325 (1983; Zbl 0518.68031) Full Text: DOI
Virupakshia, A. R.; Pratapa Reddy, V. C. V. A simple random test procedure for detection of single intermittent fault in combinational circuits. (English) Zbl 0514.94024 IEEE Trans. Comput. 32, 594-597 (1983). MSC: 94C10 PDFBibTeX XMLCite \textit{A. R. Virupakshia} and \textit{V. C. V. Pratapa Reddy}, IEEE Trans. Comput. 32, 594--597 (1983; Zbl 0514.94024) Full Text: DOI
Lin, Gordon K.; Menon, Premachandran R. Totally preset checking experiments for sequential machines. (English) Zbl 0514.68056 IEEE Trans. Comput. 32, 101-108 (1983). MSC: 68Q45 PDFBibTeX XMLCite \textit{G. K. Lin} and \textit{P. R. Menon}, IEEE Trans. Comput. 32, 101--108 (1983; Zbl 0514.68056) Full Text: DOI
Oikonomou, Kostas N.; Kain, Richard Y. Abstractions for node level passive fault detection in distributed systems. (English) Zbl 0513.68042 IEEE Trans. Comput. 32, 543-550 (1983). MSC: 68Q45 94C10 68N99 PDFBibTeX XMLCite \textit{K. N. Oikonomou} and \textit{R. Y. Kain}, IEEE Trans. Comput. 32, 543--550 (1983; Zbl 0513.68042) Full Text: DOI
Pradhan, Dhiraj K. Sequential network design using extra inputs for fault detection. (English) Zbl 0513.68041 IEEE Trans. Comput. 32, 319-323 (1983). MSC: 68Q45 94C10 94C15 PDFBibTeX XMLCite \textit{D. K. Pradhan}, IEEE Trans. Comput. 32, 319--323 (1983; Zbl 0513.68041) Full Text: DOI
Susskind, Alfred K. Testing by verifying Walsh coefficients. (English) Zbl 0512.94030 IEEE Trans. Comput. 32, 198-201 (1983). MSC: 94C30 94C12 PDFBibTeX XMLCite \textit{A. K. Susskind}, IEEE Trans. Comput. 32, 198--201 (1983; Zbl 0512.94030) Full Text: DOI
Chiang, Kuang-Wei; Vranesic, Zvonko G. A tree representation of combinational networks. (English) Zbl 0512.94028 IEEE Trans. Comput. 32, 315-319 (1983). MSC: 94C15 94C12 PDFBibTeX XMLCite \textit{K.-W. Chiang} and \textit{Z. G. Vranesic}, IEEE Trans. Comput. 32, 315--319 (1983; Zbl 0512.94028) Full Text: DOI
Ramanatha, K. S.; Biswas, Nripendra N. An on-line algorithm for the location of cross point faults in programmable logic arrays. (English) Zbl 0512.94021 IEEE Trans. Comput. 32, 438-444 (1983). MSC: 94C12 PDFBibTeX XMLCite \textit{K. S. Ramanatha} and \textit{N. N. Biswas}, IEEE Trans. Comput. 32, 438--444 (1983; Zbl 0512.94021) Full Text: DOI