Han, Sang-Eon; Lee, Sik Remarks on homotopies associated with Khalimsky topology. (English) Zbl 1337.55002 Honam Math. J. 37, No. 4, 577-593 (2015). MSC: 55-02 55Q70 52Cxx 55P15 68R10 68U05 PDFBibTeX XMLCite \textit{S.-E. Han} and \textit{S. Lee}, Honam Math. J. 37, No. 4, 577--593 (2015; Zbl 1337.55002) Full Text: DOI
Han, Sang-Eon; Lee, Sik Utility of digital covering theory. (English) Zbl 1351.55001 Honam Math. J. 36, No. 3, 695-706 (2014). MSC: 55-02 55Q70 52C99 55P15 68R10 68U05 PDFBibTeX XMLCite \textit{S.-E. Han} and \textit{S. Lee}, Honam Math. J. 36, No. 3, 695--706 (2014; Zbl 1351.55001) Full Text: DOI
Han, Sang-Eon Remarks on simply \(k\)-connectivity and \(k\)-deformation retract in digital topology. (English) Zbl 1359.55010 Honam Math. J. 36, No. 3, 519-530 (2014). MSC: 55P99 68U05 68U10 PDFBibTeX XMLCite \textit{S.-E. Han}, Honam Math. J. 36, No. 3, 519--530 (2014; Zbl 1359.55010) Full Text: DOI
Han, Sang-Eon An equivalent property of a normal adjacency of a digital product. (English) Zbl 1300.55018 Honam Math. J. 36, No. 1, 199-215 (2014). MSC: 55Q70 52C17 55P15 68R10 68U05 PDFBibTeX XMLCite \textit{S.-E. Han}, Honam Math. J. 36, No. 1, 199--215 (2014; Zbl 1300.55018) Full Text: DOI
Han, Sang-Eon; Lee, Sik Remarks on digital products with normal adjacency relations. (English) Zbl 1300.55019 Honam Math. J. 35, No. 3, 515-524 (2013). MSC: 55Q70 52C17 55P15 68R10 68U05 PDFBibTeX XMLCite \textit{S.-E. Han} and \textit{S. Lee}, Honam Math. J. 35, No. 3, 515--524 (2013; Zbl 1300.55019) Full Text: DOI
Kim, In-Soo; Han, Sang-Eon Digital covering theory and its applications. (English) Zbl 1198.68284 Honam Math. J. 30, No. 4, 589-602 (2008). MSC: 68U05 52C17 55P15 55Q70 PDFBibTeX XMLCite \textit{I.-S. Kim} and \textit{S.-E. Han}, Honam Math. J. 30, No. 4, 589--602 (2008; Zbl 1198.68284) Full Text: DOI
Han, Sang-Eon Digital geometry and its applications. (English) Zbl 1198.68278 Honam Math. J. 30, No. 2, 207-217 (2008). MSC: 68U05 52Cxx 55P10 55P15 55Q70 PDFBibTeX XMLCite \textit{S.-E. Han}, Honam Math. J. 30, No. 2, 207--217 (2008; Zbl 1198.68278) Full Text: DOI