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Comas, C.; Delicado, P.; Mateu, J. A second order approach to analyse spatial point patterns with functional marks. (English) Zbl 1274.62359 Test 20, No. 3, 503-523 (2011). MSC: 62H11 60G55 62M30 62P20 PDFBibTeX XMLCite \textit{C. Comas} et al., Test 20, No. 3, 503--523 (2011; Zbl 1274.62359) Full Text: DOI
Cressie, Noel A. C. Statistics for spatial data. (English) Zbl 0799.62002 Wiley Series in Probability and Mathematical Statistics. New York etc.: John Wiley & Sons, Inc. (ISBN 0-471-84336-9/hbk). xx, 900 p. (1991). Reviewer: V.Schmidt (Ulm) MSC: 62-02 62H11 62M30 60G55 86A32 62M40 60G57 PDFBibTeX XMLCite \textit{N. A. C. Cressie}, Statistics for spatial data. New York etc.: John Wiley \& Sons, Inc. (1991; Zbl 0799.62002)
Penttinen, A.; Stoyan, D. Statistical analysis for a class of line segment processes. (English) Zbl 0688.62054 Scand. J. Stat. 16, No. 2, 153-168 (1989). MSC: 62M99 60G55 62P10 PDFBibTeX XMLCite \textit{A. Penttinen} and \textit{D. Stoyan}, Scand. J. Stat. 16, No. 2, 153--168 (1989; Zbl 0688.62054)
Ogata, Yosihiko; Katsura, Koichi Likelihood analysis of spatial inhomogeneity for marked point patterns. (English) Zbl 0668.62084 Ann. Inst. Stat. Math. 40, No. 1, 29-39 (1988). MSC: 62P99 62F15 62N99 65C99 PDFBibTeX XMLCite \textit{Y. Ogata} and \textit{K. Katsura}, Ann. Inst. Stat. Math. 40, No. 1, 29--39 (1988; Zbl 0668.62084) Full Text: DOI
Ogata, Yosihiko; Tanemura, Masaharu Estimation of interaction potentials of marked spatial point patterns through the maximum likelihood method. (English) Zbl 0607.62121 Biometrics 41, 421-433 (1985). MSC: 62M99 62P10 60J45 PDFBibTeX XMLCite \textit{Y. Ogata} and \textit{M. Tanemura}, Biometrics 41, 421--433 (1985; Zbl 0607.62121) Full Text: DOI