PASSAT swMATH ID: 10074 Software Authors: Shi, J., Fey, G., Drechsler, R., Glowatz, A., Hapke, F., Schlöffel, J. Description: PASSAT: Effcient SAT-based test pattern generation for industrial circuits. Automatic test pattern generation (ATPG) based on Boolean satisfiability (SAT) has been proposed as an alternative to classical search algorithms. SAT-based ATPG turned out to be more robust and more effective by formulating the problem as a set of equations. In this paper, we present an efficient ATPG algorithm that makes use of powerful SAT-solving techniques. Problem specific heuristics are applied to guide the search. In contrast to previous SAT-based algorithms, the new approach can also cope with tri-states. The algorithm has been implemented as the tool PASSAT. Experimental results on large industrial circuits are given to demonstrate the quality and efficiency of the algorithm. Homepage: http://ieeexplore.ieee.org/xpl/login.jsp?tp=&arnumber=1430135 Related Software: HANNIBAL; SOCRATES; HITEC; BerkMin; Chaff; SATIRE; MiniSat; SystemC; Pinapa; SATORI; Daikon; ANTLR; FoCs; zChaff; CirCUs Cited in: 3 Documents Cited by 4 Authors 3 Drechsler, Rolf 3 Fey, Görschwin 1 Eggersglüß, Stephan 1 Tille, D. Cited in 0 Serials Cited in 3 Fields 2 Computer science (68-XX) 2 Information and communication theory, circuits (94-XX) 1 Systems theory; control (93-XX) Citations by Year